STROBE-Contributed or Non-Refereed Publications


Characterization and imaging of nanostructured materials using tabletop extreme ultraviolet light sources

R. Karl, G.F. Mancini, J. Knobloch, T. Frazer, J.N. Hernandez-Charpak, ├▒aAbad Mayor, M. Tanksalvala, C.L. Porter, C.S. Bevis, W. Chao, D.E. Adams, H.C. Kapteyn, M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXIIMetrology, Inspection, and Process Control for Microlithography XXXII, (2018).

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

W.A. Hubbard, M. Mecklenburg, H.Leung Chan, B.C. Regan, Microscopy and Microanalysis, (2018).


Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

B. Zutter, M. Mecklenburg, B.C. Regan, Microscopy and Microanalysis 2372, 378 - 379 (2017).

3D Imaging of Nanoalloy Catalysts at Atomic Resolution

J. Zhou, Y. Yang, Z. Zhao, C. Ophus, P. Ercius, Y. Huang, J. Miao, Microscopy and Microanalysis 23, 2032 - 2033 (2017).

In Situ Optical Microscopy of the Electrochemical Intercalation of Lithium into Single Crystal Graphite

J.J. Lodico, M. Woodall, H.L. Chan, W.A. Hubbard, B.C. Regan, Microscopy and Microanalysis 23, 1982 - 1983 (2017).

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

W.A. Hubbard, T. Joshi, M. Mecklenburg, B. Zutter, P. Borisov, D. Lederman, B.C. Regan, Microscopy and Microanalysis 23, 1428 - 1429 (2017).

Imaging the spatial modulation of a relativistic electron beam

C. Zhang, W.S. Graves, L.E. Malin, J.C.H. Spence, E.A. Nanni, D. Cesar, J. Maxson, A. Urbanowicz, P. Musumeci, 8th International Particle Accelerator Conference (IPAC 2017), 480-482 (2017).

Full-Field Functional Imaging of Nanoscale Dynamics Using Tabletop High Harmonics

R.M. Karl, G.F. Mancini, D. Gardner, E. Shanblatt, J. Knobloch, T. Frazer, J. Hernandez-Charpak, ├▒aAbad Mayor, M. Tanksalvala, C. Porter, C. Bevis, D. Adams, H. Kapteyn, M. Murnane, CLEO: Applications and TechnologyConference on Lasers and Electro-Optics, (2017).