BEGIN:VCALENDAR
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METHOD:PUBLISH
CALSCALE:GREGORIAN
PRODID:-//WordPress - MECv6.4.2//EN
X-ORIGINAL-URL:https://strobe.colorado.edu/
X-WR-CALNAME:STROBE
X-WR-CALDESC:Building the Microscopes of Tomorrow
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-PUBLISHED-TTL:PT1H
X-MS-OLK-FORCEINSPECTOROPEN:TRUE
BEGIN:VEVENT
CLASS:PUBLIC
DTSTART;TZID=America/Denver:20180416T150000
DTEND;TZID=America/Denver:20180416T150000
DTSTAMP:20200613T061100
UID:MEC-f96f40bdb8cb393c6e35be1f7464e339@strobe.colorado.edu
CREATED:20200613
LAST-MODIFIED:20200613
PRIORITY:5
TRANSP:OPAQUE
SUMMARY:STROBE Seminar: Controlled Environment Nano-Imaging Free From Radiation Damage by X-ray Laser Diffraction
DESCRIPTION:Coherent diffractive imaging (CDI) is a growing technique in photon science. CDI has been demonstrated to be a powerful tool for visualizing cells and organelles using synchrotron radiation. X-ray free-electron lasers (XFELs) with femtosecond 3pulse durations further extends the ability of CDI to achieve spatial resolution beyond the conventional radiation-damage limitation. We performed live cell nano-imaging using a Japanese XFEL facility, SACLA. We employed pulsed coherent X-ray solution scattering (PCXSS), a form of X-ray CDI, developed by our group [1,2]. A unique feature of PCXSS is to keep solution sample under a controlled environment in micro-liquid enclosure array (MLEA) chips. We succeeded in reconstructing a live cell image from a coherent diffraction pattern recorded with a single XFEL shot. The reconstructed image quantitatively revealed the internal structures, e.g. high image intensity structure indicative of dense DNA [2]. PCXSS can also be effectively applied to nano-imaging of materials functional in solution. For example, we successfully imaged gold nanoparticle self-assemblies, developed as drug delivery carriers, in solution [3,4]. We also initiated industrial application of XFEL in collaboration with Toyota Motor Corp [5]. Furthermore, as recent developments in PCXSS, we report on time-resolved pump-probe measurement, temperature-controlled measurement, utilization of ~100-nm focused XFEL, etc.\n
URL:https://strobe.colorado.edu/news-events/events/strobe-seminar-controlled-environment-nano-imaging-free-from-radiation-damage-by-x-ray-laser-diffraction/
LOCATION:JILA Foothills Conference Room
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