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X-ORIGINAL-URL:https://strobe.colorado.edu/
X-WR-CALNAME:STROBE
X-WR-CALDESC:Building the Microscopes of Tomorrow
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BEGIN:VEVENT
CLASS:PUBLIC
DTSTART;TZID=America/Denver:20190318T130000
DTEND;TZID=America/Denver:20190318T130000
DTSTAMP:20200613T063100
UID:MEC-3ebd728de6fa78aa8bc932e9abece9c0@strobe.colorado.edu
CREATED:20200613
LAST-MODIFIED:20200613
PRIORITY:5
TRANSP:OPAQUE
SUMMARY:STROBE Seminar: David Ren, “3D Phase Contrast Tomography with Atomic Resolution”
DESCRIPTION:Electron tomography is a technique used in both materials science and structural biology to image features well below optical resolution limit. In this work, we present a new algorithm for reconstructing the three-dimensional(3D) electrostatic potential of a sample at atomic resolution from phase contrast imaging using high-resolution transmission electron microscopy. Our method accounts for dynamical and strong phase scattering, providing more accurate results with much lower electron doses than those current atomic electron tomography experiments. Our simulation results show that, for a wide range of experimental parameters, we can accurately determine both atomic positions and species, and also identify vacancies even for light elements such as silicon and disordered materials such as amorphous silicon dioxide and also identify vacancies. Our preliminary experimental results also show promising outcome of the method.\n
URL:https://strobe.colorado.edu/news-events/events/strobe-seminar-david-ren-3d-phase-contrast-tomography-with-atomic-resolution/
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