A STROBE team led by Ke Xu at Berkeley adapted advanced super-resolution microscopy techniques developed by the Weiss group at UCLA, to rapidly image graphene nanoribbons (GNRs) and carbon nanotubes (CNTs). These are important functional materials with great promise in nano-electronics and other applications. However, it has been a challenge to visualize and characterize them in a high-throughput manner due to their small physical dimensions. Temporal fluorescence intensity fluctuations in these samples enabled the reconstruction of SRM images through superresolution optical fluctuation imaging (SOFI) and the related superresolution radial fluctuation (SRRF) analysis methods.