STROBE-contributed + Non-Refereed

1

Robust and reliable actinic ptychographic imaging of highly periodic structures in EUV photomasks

B. Wang, N. Brooks, M. Tanksalvala, Y. Esashi, N. Jenkins, P. Johnsen, I. Binnie, G. Gui, Y. Shao, M. Murnane, H. Kapteyn, Photomask Technology 2022, 12293, 122930D, (2022).

10.1117/12.2641726

2

High-Resolution Conductivity Mapping with STEM EBIC

W. Hubbard, H. Chan, B. C. Regan, International Symposium for Testing and Failure Analysis, istfa2022p0251, 251-253, (2022).

10.31399/asm.cp.istfa2022p0251

3

Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

R. Jin, B. Zutter, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 2068-2069, (2021).

10.1017/s1431927621007480

4

A Multislice Approach to Quantify Laser-Induced Lattice Temperature from Ultrafast Electron Diffraction Measurements of Single-Crystal Films

D. Durham, K. Siddiqui, C. Ophus, A. Minor, D. Filippetto, Microscopy and Microanalysis, 28, 888-890, (2022).

10.1017/s1431927622003920

5

Separation of EBIC Modes with Two-Channel STEM EBIC

W. A. Hubbard, H. Chan, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 28, 2508-2509, (2022).

10.1017/s143192762200959x

6

Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC

H. Chan, S. S. Fields, T. O'Neill, Y. Chen, W. A. Hubbard, J. F. Ihlefeld, B. C. Regan, Microscopy and Microanalysis, 28, 2270-2271, (2022).

10.1017/s1431927622008728

7

In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution

Y. Chen, H. Chan, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 2314-2315, (2022).

10.1017/s1431927622008893

8

Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction

Y. Chen, J. J. Lodico, X. Ling, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 576-577, (2022).

10.1017/s1431927622002884

9

Commissioning of an X-Band Cavity for Longitudinal Phase Space Linearization at UCLA PEGASUS Laboratory

P. Denham, P. Musumeci, A. Ody, Proceedings of the 13th International Particle Accelerator Conference, Thailand, (2022).

10.18429/JACOW-IPAC2022-THPOST040

10

Direct observation of topological magnetic monopoles using soft x-ray vector ptychography at 10 nm resolution

C. Liao, A. Rana, E. Iacocca, J. Zou, M. Pham, X. Lu, E. Subramanian, Y. Lo, S. A. Ryan, C. S. Bevis, R. M. Karl, A. J. Glaid, J. Rable, P. Mahale, J. Hirst, T. Ostler, W. Liu, C. M. O'Leary, Y. Yu, K. Bustillo, H. Ohldag, D. A. Shapiro, S. Yazdi, T. E. Mallouk, S. J. Osher, H. C. Kapteyn, V. H. Crespi, J. V. Badding, Y. Tserkovnyak, J. Miao, M. M. Murnane, Optica High-brightness Sources and Light-driven Interactions Congress 2022, JTh6A.3, (2022).

10.1364/euvxray.2022.jth6a.3

11

Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

C. Ophus, S. E. Zeltmann, A. Bruefach, A. Rakowski, B. H. Savitzky, A. M. Minor, M. C. Scott, Microscopy and Microanalysis, 1-14, (2022).

10.1017/s1431927622000101

12

4D Beam Tomography at the UCLA Pegasus Laboratory

V. Guo, P. Denham, P. Musumeci, A. Ody, Y. Park, Proceedings of the 10th International Beam Instrumentation Conference, Rep. of Korea, (2021).

10.18429/JACOW-IBIC2021-TUPP15

13

Soft x-ray linear dichroic ptychography: the study of crystal orientation in biominerals

V. J. Schoeppler, M. A. Marcus, Y. Yu, R. S. Celestre, K. C. Bustillo, R. W. Falcone, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods V, Proc. SPIE 11839, 118390D, (2021).

10.1117/12.2594172

14

In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 27, 168-169, (2021).

10.1017/s1431927621001203

15

Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

B. C. Regan, J. Lodico, H. Chan, M. Mecklenburg, W. Hubbard, Microscopy and Microanalysis, 27, 2354-2355, (2021).

10.1017/s1431927621008461

16

Modern STEM EBIC: Emerging Modes and Methods

W. Hubbard, M. Mecklenburg, J. Lodico, B. Zutter, H. Chan, B. C. Regan, Microscopy and Microanalysis, 27, 2350-2352, (2021).

10.1017/s143192762100845x

17

Visualizing the Electron Wind Force in the Elastic Regime

M. Mecklenburg, B. Zutter, W. A. Hubbard, X. Ling, B. C. Regan, Microscopy and Microanalysis, 27, 106-107, (2021).

10.1017/s1431927621001008

18

Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis

T. O'Neill, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1540-1541, (2021).

10.1017/s1431927621005687

19

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

X. Ling, J. Lodico, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1608-1609, (2021).

10.1017/s1431927621005912

20

Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value

S. D. Findlay, H. G. Brown, P. M. Pelz, C. Ophus, J. Ciston, L. J. Allen, Microscopy and Microanalysis, 27, 744-757, (2021).

10.1017/s1431927621000490

21

Maximizing the Field of View in Blind Ptychography

N. W. Jenkins, M. Tanksalvala, Y. Esashi, Z. Zhang, C. S. Bevis, M. N. Jacobs, P. Johnsen, C. Liao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.1, (2021).

10.1364/cosi.2021.cw6b.1

22

Stratified Diffractive Optical Elements for Azimuthal Multiplexing

H. Wang, R. Piestun, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), (2021).

10.1364/dh.2021.dth7c.6

23

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

P. M. Pelz, A. Rakowski, L. Rangel DaCosta, B. H. Savitzky, M. C. Scott, C. Ophus, Microscopy and Microanalysis, 27, 835-848, (2021).

10.1017/s1431927621012083

24

Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory

P. Denham, P. Musumeci, Proceedings of the 12th International Particle Accelerator Conference, Brazil, (2021).

10.18429/JACOW-IPAC2021-TUPAB417

25

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

B. H. Savitzky, S. E. Zeltmann, L. A. Hughes, H. G. Brown, S. Zhao, P. M. Pelz, T. C. Pekin, E. S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M. T. Janish, M. M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K. C. Bustillo, P. Ercius, M. C. Scott, J. Ciston, A. M. Minor, C. Ophus, Microscopy and Microanalysis, 27, 712-743, (2021).

10.1017/s1431927621000477

26

Multiview Virtual Confocal Microscopy Through A Multimode Fiber

S. Singh, S. Labouesse, R. Piestun, 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), (2021).

10.1109/isbi48211.2021.9433950

27

Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction

K. M. Siddiqui, D. B. Durham, F. Cropp, S. Rajpurohit, C. Ophus, Y. Zhu, J. Carlstroem, C. Stavrakas, Z. Q. Mao, A. Raja, P. Musumeci, L. Z. Tan, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Phenomena and Nanophotonics XXV, (2021).

10.1117/12.2577621

28

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

B. Wang, M. Tanksalvala, Z. Zhang, Y. Esashi, N. Jenkins, M. Murnane, H. Kapteyn, C. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, (2021).

10.1117/12.2584728

29

Multibeam Electron Diffraction

X. Hong, S. E. Zeltmann, B. H. Savitzky, L. Rangel DaCosta, A. Müller, A. M. Minor, K. C. Bustillo, C. Ophus, Microscopy and Microanalysis, 27, 129-139, (2021).

10.1017/s1431927620024770

30

Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning

K. Kukula, D. Farmer, J. Duran, N. Majid, C. Chatterley, J. Jessing, Y. Li, 2021 IEEE 11th Annual Computing and Communication Workshop and Conference (CCWC), (2021).

10.1109/ccwc51732.2021.9375955

31

Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light

N. W. Jenkins, M. Tanksalvala, Y. Esashi, C. L. Porter, B. Wang, N. Horiguchi, M. N. Jacobs, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.ew3a.4

32

Generating Relativistic Intensities via Staged Pulse Compression in Dielectric Media

M. M. Stanfield, H. H. Allison, N. F. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.jm3a.22

33

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).

10.1117/12.2567540

34

Ultrafast structural dynamics of materials captured by relativistic electron bunches

K. Siddiqui, D. B. Durham, F. Cropp, A. Schmid, P. Musumeci, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Nonlinear Imaging and Spectroscopy VIII, (2020).

10.1117/12.2568320

35

Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography

J. Zhou, Y. Yang, Y. Yang, C. Ophus, F. Sun, A. Schmid, H. Zeng, P. Ercius, J. Miao, Microscopy and Microanalysis, 26, 1794-1796, (2020).

10.1017/s1431927620019364

36

Atomic Electron Tomography: Past, Present and Future

J. Miao, X. Tian, D. Kim, J. Zhou, Y. Yang, Y. Yang, Y. Yuan, C. Ophus, A. Schmid, S. Yang, F. Sun, C. Ciccarino, B. Duschatko, J. Idrobo, P. Narang, H. Zeng, P. Ercius, Microscopy and Microanalysis, 652-654, (2020).

10.1017/s143192762001541x

37

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 26, 904-905, (2020).

10.1017/s1431927620016268

38

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).

10.1017/s1431927620013604

39

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).

10.1017/s1431927620021510

40

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).

10.1017/s1431927620014749

41

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).

10.1017/s1431927620023880

42

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).

10.1017/s1431927620013756

43

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).

10.18260/1-2--34684

44

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).

10.1364/cleo_qels.2020.ff2c.7

45

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

46

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

47

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).

10.1364/fio.2019.jw4a.50

48

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).

10.18429/JACOW-NAPAC2019-MOPLH04

49

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

50

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).

10.1117/12.2531177

Publications

STROBE-contributed + Non-Refereed Publications

2022