STROBE-contributed + Non-Refereed Publications

Showing publications 1 – 50 of 53

2020

1

A comprehensive experimental system for measuring molecular two-photon absorption using an ultrafast entangled photon pair excitation source

A. Mikhaylov, K. M. Parzuchowski, M. D. Mazurek, D. J. Lum, T. Gerrits, C. H. Champ, M. J. Stevens, R. Jimenez, Advanced Optical Techniques for Quantum Information, Sensing, and Metrology, (2020).
2

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

2019

3

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).
4

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).
5

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).
6

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).
7

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Y. Esashi, C. L. Porter, M. Tanksalvala, G. P. Miley, N. Horiguchi, J. L. Knobloch, J. Zhou, R. M. Karl, P. Johnsen, C. S. Bevis, B. Wang, S. L. Cousin, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Microscopy and Microanalysis, 25, 116-117, (2019).
8

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).
9

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).
10

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

W. A. Hubbard, J. J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 256-257, (2019).
11

Probing thermal and acoustic dynamics of inverse silicon metallatices

C. C. Bevis, B. B. Abad, J. J. Knobloch, T. T. Frazer, A. A. Adak, J. J. Hernández-Charpak, H. H. Cheng, A. A. Grede, N. N. Giebink, N. N. Nova, T. T. Mallouk, P. P. Mahale, W. W. Chen, Y. Y. Xiong, I. I. Dabo, V. V. Crespi, D. D. Talreja, H. H. Kapteyn, V. V. Gopalan, J. J. Badding, M. M. Murnane, Microscopy and Microanalysis, 25, 2174-2175, (2019).
12

Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

M. Mecklenburg, W. A. Hubbard, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 2354-2355, (2019).
13

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

B. Wang, R. Karl, G. Mancini, J. Knobloch, T. Frazer, B. Mayor, M. Tanksalvala, C. Bevis, H. Kapteyn, J. N. Hernandez-Charpak, M. Murnane, Microscopy and Microanalysis, 25, 42-43, (2019).
14

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

B. T. Zutter, H. Kim, W. A. Hubbard, D. Ren, J. J. Lodico, T. Chang, D. Huffaker, B. C. Regan, Microscopy and Microanalysis, 25, 1618-1619, (2019).
15

Mapping Electronic State Changes with STEM EBIC

B. C. Regan, T. Joshi, J. J. Lodico, B. T. Zutter, H. Chan, M. Mecklenburg, D. Lederman, W. A. Hubbard, Microscopy and Microanalysis, 25, 1396-1397, (2019).
16

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

H. Chan, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1846-1847, (2019).
17

A new approach for measuring of two-photon absorption using entangled photon pair excitation

A. Mikhaylov, M. D. Mazurek, K. M. Parzuchowski, T. Gerrits, M. J. Stevens, R. Jimenez, Rochester Conference on Coherence and Quantum Optics (CQO-11), (2019).
18

Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, N. Horiguchi, R. M. Karl, P. Johnsen, C. S. Bevis, N. W. Jenkins, B. Wang, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), (2019).
19

High Performance Partial Coherent X-Ray Ptychography

P. Enfedaque, H. Chang, B. Enders, D. Shapiro, S. Marchesini, Computational Science – ICCS 2019, 11536, 46 - 59, (2019).
20

SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

C. Liao, Y. Lo, J. Zhou, A. Rana, C. S. Bevis, G. Gui, B. Enders, K. Cannon, D. Shapiro, C. Bennett, H. Kapteyn, R. Falcone, J. Miao, M. Murnane, Microscopy and Microanalysis, 25, 112-113, (2019).
21

An Extreme Ultraviolet Spin Grating for Spatially Resolved, Hyperspectral Magnetic Dichroism Spectroscopies

N. J. Brooks, K. M. Dorney, J. L. Ellis, D. D. Hickstein, Q. L. Nguyen, C. Gentry, C. Hernández-García, D. Zusin, J. M. Shaw, G. S. Matthijs Jansen, S. Witte, H. C. Kapteyn, M. M. Murnane, Conference on Lasers and Electro-Optics, (2019).
22

Tabletop EUV Coherent Diffractive Imaging and Small Angle Scattering of Colloidal Crystals

M. Giulia F., R. Karl, S. Elisabeth, B. Charles, G. Dennis, T. Michael, R. Jennifer, A. Daniel, K. Henry, B. John, M. Thomas, M. Margaret, EPJ Web of Conferences, 205, 05015, (2019).
23

Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams

B. Abad, T. Frazer, J. Knobloch, J. Hernández-Charpak, H. Cheng, A. Grede, N. Giebink, T. Mallouk, P. Mahale, W. Chen, Y. Xiong, I. Dabo, V. Crespi, D. Talreja, V. Gopalan, J. Badding, H. Kapteyn, M. Murnane, EPJ Web of Conferences, 205, 04006, (2019).
24

Ultrafast dynamic imaging of thermal and acoustic dynamics in nanosystems using a tabletop high harmonic source

C. Bevis, K. r. Robert, G. F. Mancini, D. Gardner, E. Shanblatt, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Mayor, M. Tanksalvala, C. Porter, D. Adams, H. Kapteyn, M. M. Murnane, EPJ Web of Conferences, 205, 04005, (2019).
25

Variable-wavelength tabletop-scale EUV ptychographic complex imaging reflectometry for 3D composition determination

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, R. Karl, P. Johnsen, N. W. Jenkins, C. S. Bevis, B. Wang, J. Thurston, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXIII, (2019).

2018

26

High-coherence relativistic electron probes for ultrafast structural dynamics

P. Musumeci, B. B. Griffin, D. Filippetto, F. Ji, A. Minor, F. Riminucci, D. B. Durham, X. Wang, M. Centurion, D. Slaughter, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1, 1, (2018).
27

Dataflow at the COSMIC Beamline – Stream Processing and Supercomputing

B. Enders, K. Nowrouzi, H. Krishnan, S. Marchesini, J. Park, Y. Yu, D. A. Shapiro, Microscopy and Microanalysis, 24, 58-59, (2018).
28

Nanoscale Visualization of Magnetic Contrasts with Soft X-ray Spectro-Ptychography at the Advanced Light Source

Y. Yu, R. Celestre, B. Enders, K. Nowrouzi, H. Padmore, T. Warwick, J. Jeong, D. A. Shapiro, Microscopy and Microanalysis, 24, 530-531, (2018).
29

The COSMIC Imaging Beamline at the Advanced Light Source: a new facility for spectro-microscopy of nano-materials

D. A. Shapiro, R. Celestre, B. Enders, J. Joseph, H. Krishnan, M. A. Marcus, K. Nowrouzi, H. Padmore, J. Park, A. Warwick, Y. Yu, Microscopy and Microanalysis, 24, 8-11, (2018).
30

Scanning TEM Electron Beam Induced Current Imaging in Water

J. J. Lodico, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 24, 252-253, (2018).
31

Electromigration of Copper in Lithographically-Defined Aluminum Nanowires

B. Zutter, M. Mecklenburg, S. Aloni, B. C. Regan, Microscopy and Microanalysis, 24, 2190-2191, (2018).
32

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

B. C. Regan, J. Lodico, W. A. Hubbard, Microscopy and Microanalysis, 24, 1806-1807, (2018).
33

Simultaneous second harmonic generation and Mueller Matrix polarimetry imaging of the rat cornea

I. Saytashev, N. Lopez, J. Chue-Sang, J. Ramella-Roman, Investigative Ophthalmology & Visual Science , 59, 5844, (2018).
34

Electron microscope based setup for single-shot 4D trace space reconstruction of bright electron beams

J. Giner Navarro, R. Aßmann, D. Cesar, B. Marchetti, D. Marx, P. Musumeci, Proceedings of the 9th International Particle Accelerator Conference, (2018).
35

Sub-wavelength Resolution, Wide Field-Of-View, and Quantitative 13nm Imaging in Reflection and Transmission with a Tabletop High Harmonic Source

C. Porter, M. Tanksalvala, D. Gardner, G. Mancini, M. Gerrity, G. Miley, X. Zhang, N. Horiguchi, E. Shanblatt, B. Galloway, Y. Esashi, C. Bevis, R. Karl, P. Johnson, D. Adams, H. Kapteyn, M. Murnane, High-Brightness Sources and Light-driven Interactions, (2018).
36

Characterization and imaging of nanostructured materials using tabletop extreme ultraviolet light sources

R. Karl, G. F. Mancini, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Abad Mayor, M. Tanksalvala, C. L. Porter, C. S. Bevis, W. Chao, D. E. Adams, H. C. Kapteyn, M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).
37

Complex EUV imaging reflectometry: spatially resolved 3D composition determination and dopant profiling with a tabletop 13nm source

R. Karl, P. Johnsen, D. E. Adams, H. C. Kapteyn, M. M. Murnane, N. Horiguchi, C. L. Porter, M. Tanksalvala, M. Gerrity, G. P. Miley, X. Zhang, C. S. Bevis, Y. Esashi, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).
38

Multi-model imaging of the interaction of nanomaterials with cells

J. Miao, IUCrJ, 5, 122-123, (2018).
39

Multiphoton microscopy of ECM proteins in baboon aortic leaflet

M. Gonzalez, I. Saytashev, B. Gonzalez, A. Pinero, M. Perez, S. Ramaswamy, J. C. Ramella-Roman, C. Luna, Diagnostic and Therapeutic Applications of Light in Cardiology 2018, (2018).
40

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

W. A. Hubbard, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 24, 1846-1847, (2018).

2017

41

First Demonstration of Sub-Wavelength Imaging at Short Wavelengths

D. F. Gardner, E. R. Shanblatt, M. Tanksalvala, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, B. Zhang, M. D. Seaberg, G. F. Mancini, D. E. Adams, H. C. Kapteyn, M. M. Murnane, Frontiers in Optics 2017, (2017).
42

Detailed In Situ Observations of Electromigration in Aluminum Wires

M. Mecklenburg, B. Zutter, W. A. Hubbard, S. Aloni, B. C. Regan, Microscopy and Microanalysis, 23, 1450-1451, (2017).
43

Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

B. Zutter, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 2372, 378-379, (2017).
44

Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging

W. A. Hubbard, E. R. White, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 23, 1506-1507, (2017).
45

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

W. A. Hubbard, T. Joshi, M. Mecklenburg, B. Zutter, P. Borisov, D. Lederman, B. C. Regan, Microscopy and Microanalysis, 23, 1428-1429, (2017).
46

3D Imaging of Nanoalloy Catalysts at Atomic Resolution

J. Zhou, Y. Yang, Z. Zhao, C. Ophus, P. Ercius, Y. Huang, J. Miao, Microscopy and Microanalysis, 23, 2032-2033, (2017).
47

In Situ Optical Microscopy of the Electrochemical Intercalation of Lithium into Single Crystal Graphite

J. J. Lodico, M. Woodall, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 23, 1982-1983, (2017).
48

In Situ Observation of Cooling in a Bismuth Telluride and Bismuth-Antimony Telluride Nanoscale Heterojunction

G. Bal, M. Mecklenburg, W. A. Hubbard, B. Vareskic, B. Zutter, S. Aloni, B. C. Regan, Microscopy and Microanalysis, 23, 1996-1997, (2017).
49

Extremely Wide Field of View Tabletop Ptychographic Imaging with 12.7 nm Illumination

C. L. Porter, M. Tanksalvala, M. Gerrity, G. P. Miley, X. Zhang, C. S. Bevis, E. R. Shanblatt, R. Karl, G. F. Mancini, D. A. Adams, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP), (2017).
50

Sub-wavelength 12.6nm Resolution Using a Tabletop High Harmonic Coherent Diffractive Microscope

C. Bevis, D. F. Gardner, M. Tanksalvala, E. R. Shanblatt, X. Zhang, B. R. Galloway, C. R. Porter, R. Karl, G. F. Mancini, D. E. Adams, H. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP), (2017).
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