STROBE-contributed + Non-Refereed Publications

Showing publications 1 – 50 of 97

2022

1

High-Resolution Conductivity Mapping with STEM EBIC

W. Hubbard, H. Chan, B. C. Regan, International Symposium for Testing and Failure Analysis, istfa2022p0251, 251-253, (2022).
2

Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

R. Jin, B. Zutter, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 2068-2069, (2021).
3

Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC

H. Chan, S. S. Fields, T. O'Neill, Y. Chen, W. A. Hubbard, J. F. Ihlefeld, B. C. Regan, Microscopy and Microanalysis, 28, 2270-2271, (2022).
4

In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution

Y. Chen, H. Chan, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 2314-2315, (2022).
5

Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction

Y. Chen, J. J. Lodico, X. Ling, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 576-577, (2022).
6

Separation of EBIC Modes with Two-Channel STEM EBIC

W. A. Hubbard, H. Chan, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 28, 2508-2509, (2022).
7

Commissioning of an X-Band Cavity for Longitudinal Phase Space Linearization at UCLA PEGASUS Laboratory

P. Denham, P. Musumeci, A. Ody, Proceedings of the 13th International Particle Accelerator Conference, Thailand, (2022).
8

Direct observation of topological magnetic monopoles using soft x-ray vector ptychography at 10 nm resolution

C. Liao, A. Rana, E. Iacocca, J. Zou, M. Pham, X. Lu, E. Subramanian, Y. Lo, S. A. Ryan, C. S. Bevis, R. M. Karl, A. J. Glaid, J. Rable, P. Mahale, J. Hirst, T. Ostler, W. Liu, C. M. O'Leary, Y. Yu, K. Bustillo, H. Ohldag, D. A. Shapiro, S. Yazdi, T. E. Mallouk, S. J. Osher, H. C. Kapteyn, V. H. Crespi, J. V. Badding, Y. Tserkovnyak, J. Miao, M. M. Murnane, Optica High-brightness Sources and Light-driven Interactions Congress 2022, JTh6A.3, (2022).
9

Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

C. Ophus, S. E. Zeltmann, A. Bruefach, A. Rakowski, B. H. Savitzky, A. M. Minor, M. C. Scott, Microscopy and Microanalysis, 1-14, (2022).

2021

10

4D Beam Tomography at the UCLA Pegasus Laboratory

V. Guo, P. Denham, P. Musumeci, A. Ody, Y. Park, Proceedings of the 10th International Beam Instrumentation Conference, Rep. of Korea, (2021).
11

Soft x-ray linear dichroic ptychography: the study of crystal orientation in biominerals

V. J. Schoeppler, M. A. Marcus, Y. Yu, R. S. Celestre, K. C. Bustillo, R. W. Falcone, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods V, Proc. SPIE 11839, 118390D, (2021).
12

Visualizing the Electron Wind Force in the Elastic Regime

M. Mecklenburg, B. Zutter, W. A. Hubbard, X. Ling, B. C. Regan, Microscopy and Microanalysis, 27, 106-107, (2021).
13

Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis

T. O'Neill, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1540-1541, (2021).
14

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

X. Ling, J. Lodico, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1608-1609, (2021).
15

In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 27, 168-169, (2021).
16

Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

B. C. Regan, J. Lodico, H. Chan, M. Mecklenburg, W. Hubbard, Microscopy and Microanalysis, 27, 2354-2355, (2021).
17

Modern STEM EBIC: Emerging Modes and Methods

W. Hubbard, M. Mecklenburg, J. Lodico, B. Zutter, H. Chan, B. C. Regan, Microscopy and Microanalysis, 27, 2350-2352, (2021).
18

Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value

S. D. Findlay, H. G. Brown, P. M. Pelz, C. Ophus, J. Ciston, L. J. Allen, Microscopy and Microanalysis, 27, 744-757, (2021).
19

Maximizing the Field of View in Blind Ptychography

N. W. Jenkins, M. Tanksalvala, Y. Esashi, Z. Zhang, C. S. Bevis, M. N. Jacobs, P. Johnsen, C. Liao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.1, (2021).
20

Stratified Diffractive Optical Elements for Azimuthal Multiplexing

H. Wang, R. Piestun, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), (2021).
21

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

P. M. Pelz, A. Rakowski, L. Rangel DaCosta, B. H. Savitzky, M. C. Scott, C. Ophus, Microscopy and Microanalysis, 27, 835-848, (2021).
22

Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory

P. Denham, P. Musumeci, Proceedings of the 12th International Particle Accelerator Conference, Brazil, (2021).
23

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

B. H. Savitzky, S. E. Zeltmann, L. A. Hughes, H. G. Brown, S. Zhao, P. M. Pelz, T. C. Pekin, E. S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M. T. Janish, M. M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K. C. Bustillo, P. Ercius, M. C. Scott, J. Ciston, A. M. Minor, C. Ophus, Microscopy and Microanalysis, 27, 712-743, (2021).
24

Multiview Virtual Confocal Microscopy Through A Multimode Fiber

S. Singh, S. Labouesse, R. Piestun, 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), (2021).
25

Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction

K. M. Siddiqui, D. B. Durham, F. Cropp, S. Rajpurohit, C. Ophus, Y. Zhu, J. Carlstroem, C. Stavrakas, Z. Q. Mao, A. Raja, P. Musumeci, L. Z. Tan, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Phenomena and Nanophotonics XXV, (2021).
26

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

B. Wang, M. Tanksalvala, Z. Zhang, Y. Esashi, N. Jenkins, M. Murnane, H. Kapteyn, C. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, (2021).
27

Multibeam Electron Diffraction

X. Hong, S. E. Zeltmann, B. H. Savitzky, L. Rangel DaCosta, A. Müller, A. M. Minor, K. C. Bustillo, C. Ophus, Microscopy and Microanalysis, 27, 129-139, (2021).
28

Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning

K. Kukula, D. Farmer, J. Duran, N. Majid, C. Chatterley, J. Jessing, Y. Li, 2021 IEEE 11th Annual Computing and Communication Workshop and Conference (CCWC), (2021).

2020

29

Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light

N. W. Jenkins, M. Tanksalvala, Y. Esashi, C. L. Porter, B. Wang, N. Horiguchi, M. N. Jacobs, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).
30

Generating Relativistic Intensities via Staged Pulse Compression in Dielectric Media

M. M. Stanfield, H. H. Allison, N. F. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).
31

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).
32

Ultrafast structural dynamics of materials captured by relativistic electron bunches

K. Siddiqui, D. B. Durham, F. Cropp, A. Schmid, P. Musumeci, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Nonlinear Imaging and Spectroscopy VIII, (2020).
33

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).
34

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).
35

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).
36

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).
37

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).
38

Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography

J. Zhou, Y. Yang, Y. Yang, C. Ophus, F. Sun, A. Schmid, H. Zeng, P. Ercius, J. Miao, Microscopy and Microanalysis, 26, 1794-1796, (2020).
39

Atomic Electron Tomography: Past, Present and Future

J. Miao, X. Tian, D. Kim, J. Zhou, Y. Yang, Y. Yang, Y. Yuan, C. Ophus, A. Schmid, S. Yang, F. Sun, C. Ciccarino, B. Duschatko, J. Idrobo, P. Narang, H. Zeng, P. Ercius, Microscopy and Microanalysis, 652-654, (2020).
40

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 26, 904-905, (2020).
41

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).
42

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).
43

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

2019

44

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).
45

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).
46

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).
47

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).
48

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).
49

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).
50

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).
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