STROBE-contributed + Non-Refereed – Page 2

51

Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis

T. O'Neill, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1540-1541, (2021).

10.1017/s1431927621005687

52

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

X. Ling, J. Lodico, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1608-1609, (2021).

10.1017/s1431927621005912

53

In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 27, 168-169, (2021).

10.1017/s1431927621001203

54

Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

B. C. Regan, J. Lodico, H. Chan, M. Mecklenburg, W. Hubbard, Microscopy and Microanalysis, 27, 2354-2355, (2021).

10.1017/s1431927621008461

55

Modern STEM EBIC: Emerging Modes and Methods

W. Hubbard, M. Mecklenburg, J. Lodico, B. Zutter, H. Chan, B. C. Regan, Microscopy and Microanalysis, 27, 2350-2352, (2021).

10.1017/s143192762100845x

56

Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value

S. D. Findlay, H. G. Brown, P. M. Pelz, C. Ophus, J. Ciston, L. J. Allen, Microscopy and Microanalysis, 27, 744-757, (2021).

10.1017/s1431927621000490

57

Maximizing the Field of View in Blind Ptychography

N. W. Jenkins, M. Tanksalvala, Y. Esashi, Z. Zhang, C. S. Bevis, M. N. Jacobs, P. Johnsen, C. Liao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.1, (2021).

10.1364/cosi.2021.cw6b.1

58

Stratified Diffractive Optical Elements for Azimuthal Multiplexing

H. Wang, R. Piestun, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), (2021).

10.1364/dh.2021.dth7c.6

59

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

P. M. Pelz, A. Rakowski, L. Rangel DaCosta, B. H. Savitzky, M. C. Scott, C. Ophus, Microscopy and Microanalysis, 27, 835-848, (2021).

10.1017/s1431927621012083

60

Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory

P. Denham, P. Musumeci, Proceedings of the 12th International Particle Accelerator Conference, Brazil, (2021).

10.18429/JACOW-IPAC2021-TUPAB417

61

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

B. H. Savitzky, S. E. Zeltmann, L. A. Hughes, H. G. Brown, S. Zhao, P. M. Pelz, T. C. Pekin, E. S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M. T. Janish, M. M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K. C. Bustillo, P. Ercius, M. C. Scott, J. Ciston, A. M. Minor, C. Ophus, Microscopy and Microanalysis, 27, 712-743, (2021).

10.1017/s1431927621000477

62

Multiview Virtual Confocal Microscopy Through A Multimode Fiber

S. Singh, S. Labouesse, R. Piestun, 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), (2021).

10.1109/isbi48211.2021.9433950

63

Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction

K. M. Siddiqui, D. B. Durham, F. Cropp, S. Rajpurohit, C. Ophus, Y. Zhu, J. Carlstroem, C. Stavrakas, Z. Q. Mao, A. Raja, P. Musumeci, L. Z. Tan, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Phenomena and Nanophotonics XXV, (2021).

10.1117/12.2577621

64

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

B. Wang, M. Tanksalvala, Z. Zhang, Y. Esashi, N. Jenkins, M. Murnane, H. Kapteyn, C. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, (2021).

10.1117/12.2584728

65

Multibeam Electron Diffraction

X. Hong, S. E. Zeltmann, B. H. Savitzky, L. Rangel DaCosta, A. Müller, A. M. Minor, K. C. Bustillo, C. Ophus, Microscopy and Microanalysis, 27, 129-139, (2021).

10.1017/s1431927620024770

66

Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning

K. Kukula, D. Farmer, J. Duran, N. Majid, C. Chatterley, J. Jessing, Y. Li, 2021 IEEE 11th Annual Computing and Communication Workshop and Conference (CCWC), (2021).

10.1109/ccwc51732.2021.9375955

67

Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light

N. W. Jenkins, M. Tanksalvala, Y. Esashi, C. L. Porter, B. Wang, N. Horiguchi, M. N. Jacobs, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.ew3a.4

68

Generating Relativistic Intensities via Staged Pulse Compression in Dielectric Media

M. M. Stanfield, H. H. Allison, N. F. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.jm3a.22

69

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).

10.1117/12.2567540

70

Ultrafast structural dynamics of materials captured by relativistic electron bunches

K. Siddiqui, D. B. Durham, F. Cropp, A. Schmid, P. Musumeci, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Nonlinear Imaging and Spectroscopy VIII, (2020).

10.1117/12.2568320

71

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).

10.1017/s1431927620014749

72

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).

10.1017/s1431927620023880

73

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).

10.1017/s1431927620013756

74

Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography

J. Zhou, Y. Yang, Y. Yang, C. Ophus, F. Sun, A. Schmid, H. Zeng, P. Ercius, J. Miao, Microscopy and Microanalysis, 26, 1794-1796, (2020).

10.1017/s1431927620019364

75

Atomic Electron Tomography: Past, Present and Future

J. Miao, X. Tian, D. Kim, J. Zhou, Y. Yang, Y. Yang, Y. Yuan, C. Ophus, A. Schmid, S. Yang, F. Sun, C. Ciccarino, B. Duschatko, J. Idrobo, P. Narang, H. Zeng, P. Ercius, Microscopy and Microanalysis, 652-654, (2020).

10.1017/s143192762001541x

76

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 26, 904-905, (2020).

10.1017/s1431927620016268

77

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).

10.1017/s1431927620013604

78

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).

10.1017/s1431927620021510

79

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).

10.18260/1-2--34684

80

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).

10.1364/cleo_qels.2020.ff2c.7

81

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

82

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

83

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).

10.1364/fio.2019.jw4a.50

84

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).

10.18429/JACOW-NAPAC2019-MOPLH04

85

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

86

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).

10.1117/12.2531177

87

Probing thermal and acoustic dynamics of inverse silicon metallatices

C. C. Bevis, B. B. Abad, J. J. Knobloch, T. T. Frazer, A. A. Adak, J. J. Hernández-Charpak, H. H. Cheng, A. A. Grede, N. N. Giebink, N. N. Nova, T. T. Mallouk, P. P. Mahale, W. W. Chen, Y. Y. Xiong, I. I. Dabo, V. V. Crespi, D. D. Talreja, H. H. Kapteyn, V. V. Gopalan, J. J. Badding, M. M. Murnane, Microscopy and Microanalysis, 25, 2174-2175, (2019).

10.1017/s1431927619011607

88

Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

M. Mecklenburg, W. A. Hubbard, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 2354-2355, (2019).

10.1017/s1431927619012509

89

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

B. Wang, R. Karl, G. Mancini, J. Knobloch, T. Frazer, B. Mayor, M. Tanksalvala, C. Bevis, H. Kapteyn, J. N. Hernandez-Charpak, M. Murnane, Microscopy and Microanalysis, 25, 42-43, (2019).

10.1017/s1431927619000941

90

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

B. T. Zutter, H. Kim, W. A. Hubbard, D. Ren, J. J. Lodico, T. Chang, D. Huffaker, B. C. Regan, Microscopy and Microanalysis, 25, 1618-1619, (2019).

10.1017/s1431927619008821

91

Mapping Electronic State Changes with STEM EBIC

B. C. Regan, T. Joshi, J. J. Lodico, B. T. Zutter, H. Chan, M. Mecklenburg, D. Lederman, W. A. Hubbard, Microscopy and Microanalysis, 25, 1396-1397, (2019).

10.1017/s1431927619007712

92

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

H. Chan, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1846-1847, (2019).

10.1017/s1431927619009966

93

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Y. Esashi, C. L. Porter, M. Tanksalvala, G. P. Miley, N. Horiguchi, J. L. Knobloch, J. Zhou, R. M. Karl, P. Johnsen, C. S. Bevis, B. Wang, S. L. Cousin, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Microscopy and Microanalysis, 25, 116-117, (2019).

10.1017/s1431927619001314

94

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).

10.1017/s1431927619009012

95

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).

10.1017/s1431927619011036

96

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

W. A. Hubbard, J. J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 256-257, (2019).

10.1017/s1431927619002010

97

Machine Learning for High Throughput HRTEM Analysis

C. Groschner, C. Choi, D. Nguyen, C. Ophus, M. Scott, Microscopy and Microanalysis, 25, 150-151, (2019).

10.1017/s143192761900148x

98

A new approach for measuring of two-photon absorption using entangled photon pair excitation

A. Mikhaylov, M. D. Mazurek, K. M. Parzuchowski, T. Gerrits, M. J. Stevens, R. Jimenez, Rochester Conference on Coherence and Quantum Optics (CQO-11), (2019).

10.1364/cqo.2019.m5a.1

99

Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, N. Horiguchi, R. M. Karl, P. Johnsen, C. S. Bevis, N. W. Jenkins, B. Wang, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), (2019).

10.1364/cosi.2019.cw3a.6

100

High Performance Partial Coherent X-Ray Ptychography

P. Enfedaque, H. Chang, B. Enders, D. Shapiro, S. Marchesini, Computational Science – ICCS 2019, 11536, 46 - 59, (2019).

10.1007/978-3-030-22734-0_4

Publications

STROBE-contributed + Non-Refereed Publications

2021