Traditional transmission electron microscopy (TEM) excels at determining the physical structure of a sample, but reveals little about the electronic structure. STROBE faculty Chris Regan at UCLA developed a new technique based on secondary electron emission (SE) and electron beam induced current (EBIC) to image the electronic structure of functioning devices with a TEM-like spatial resolution. He used this new SEEBIC technique to map the conductance of a nanodevice containing a thin silicon membrane (brown and green) separating two electrodes (blue).