Atomic Electron Tomography: Past, Present and Future

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2020
Authors
Miao, Jianwei,
Tian, Xuezeng,
Kim, Dennis,
Zhou, Jihan,
Yang, Yongsoo,
Yang, Yao,
Yuan, Yakun,
Ophus, Colin,
Schmid, Andreas,
Yang, Shize,
Sun, Fan,
Ciccarino, Christopher,
Duschatko, Blake,
Idrobo, Juan-Carlos,
Narang, Prineha,
Zeng, Hao,
Ercius, Peter
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Pages
652-654
Publication Date
2020-7-30
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S143192762001541X
DOI
10.1017/s143192762001541x

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