Tilted fluctuation electron microscopy

Refereed Designation:Refereed
Publication Type
Journal Article
Publication Year
2020
Authors
Kennedy, Ellis,
Reynolds, Neal,
Rangel DaCosta, Luis,
Hellman, Frances,
Ophus, Colin,
Scott, M. C.
Journal
Applied Physics Letters
Short Title
Appl. Phys. Lett.
Volume
117
Pages
091903
Publication Date
2020-09-01
Publisher
AIP Publishing
URL
http://dx.doi.org/10.1063/5.0015532
DOI
10.1063/5.0015532

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