Differential electron yield imaging with STXMRefereed Designation:Refereed Publication Type Journal Article Publication Year 2021 Authors Hubbard, William A., Lodico, Jared J., Ling, Xin Yi, Zutter, Brian T., Yu, Young-Sang, Shapiro, David A., Regan, B.C. Journal Ultramicroscopy Short Title Ultramicroscopy Volume 222 Pages 113198 Publication Date 2021-03-01 Publisher Elsevier BV URL http://dx.doi.org/10.1016/j.ultramic.2020.113198 DOI 10.1016/j.ultramic.2020.113198 PDF of Paper Previous Next
