Electron beam-induced current imaging with two-angstrom resolutionRefereed Designation:N/A Publication Type Journal Article Publication Year 2019 Authors Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., Regan, B.C. Journal Ultramicroscopy Short Title Ultramicroscopy Volume 207 Pages 112852 Publication Date 2019-12 Publisher Elsevier BV ISSN 3043991 URL http://dx.doi.org/10.1016/j.ultramic.2019.112852 DOI 10.1016/j.ultramic.2019.112852 PDF of Paper Previous Next
