Experimental study of energy-dependent angular broadening of MeV electron beams for high-resolution imaging in thick samplesRefereed Designation:Refereed Publication Type Journal Article Publication Year 2026 Authors Yang, Xi, Denham, Paul, Kulkarni, Atharva, Schaap, Brian, Smaluk, Victor, Wang, Tianyi, Bouet, Nathalie, Idir, Mourad, Musumeci, Pietro Journal Ultramicroscopy Short Title Ultramicroscopy Volume 279 Pages 114260 Publication Date 2026-1 Publisher Elsevier BV URL http://dx.doi.org/10.1016/j.ultramic.2025.114260 DOI 10.1016/j.ultramic.2025.114260 PDF of Paper Previous Next
