Imaging Dielectric Breakdown in Valence Change MemoryRefereed Designation:Refereed Publication Type Journal Article Publication Year 2021 Authors Hubbard, William A., Lodico, Jared J., Chan, Ho Leung, Mecklenburg, Matthew, Regan, Brian C. Journal Advanced Functional Materials Pages 2102313 Publication Date 2021-09-30 URL https://onlinelibrary.wiley.com/doi/10.1002/adfm.202102313 DOI 10.1002/adfm.202102313 PDF of Paper Previous Next
