Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2021
Authors: Regan, B. C.,

Lodico, Jared,

Chan, Ho Leung,

Mecklenburg, Matthew,

Hubbard, William
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 27
Issue: S1
Pages: 2354-2355
Publication Date: 2021-7-30
Publisher: Cambridge University Press (CUP)
URL: http://dx.doi.org/10.1017/S1431927621008461
DOI: 10.1017/s1431927621008461

STROBE Publications