Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2021
Authors
Regan, B. C.,
Lodico, Jared,
Chan, Ho Leung,
Mecklenburg, Matthew,
Hubbard, William
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
27
Issue
S1
Pages
2354-2355
Publication Date
2021-7-30
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S1431927621008461
DOI
10.1017/s1431927621008461

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