Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2021
Authors
Groschner, Catherine K.,
Choi, Christina,
Scott, Mary C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Pages
1-8
Publication Date
2021-5-6
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S1431927621000386
DOI
10.1017/s1431927621000386

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