Mapping Conductivity in the TEM with SEEBICRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2023 Authors Hubbard, William A, Chan, Ho Leung, Regan, B C Journal Microscopy and Microanalysis Volume 29 Issue 1 Pages 1851-1852 Publication Date 2023-7-22 Publisher Oxford University Press (OUP) URL http://dx.doi.org/10.1093/micmic/ozad067.956 DOI 10.1093/micmic/ozad067.956 PDF of Paper Previous Next
