STROBE Publications

Mapping Electronic State Changes with STEM EBIC

Publication Type
Journal Article
Publication Year
2019
Authors
Regan, B. C.,
Joshi, Toyanath,
Lodico, Jared J.,
Zutter, Brian T.,
Chan, Ho Leung,
Mecklenburg, Matthew,
Lederman, David,
Hubbard, William A.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
25
Issue
S2
Pages
1396-1397
Publication Date
2019-08-05
Publisher
Cambridge University Press (CUP)
ISSN
1431-9276
URL
http://dx.doi.org/10.1017/S1431927619007712
DOI
10.1017/s1431927619007712

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