Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2017
Authors
Zutter, Brian,
Mecklenburg, Matthew,
Regan, B. C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
2372
Pages
378-379
Publication Date
2017-07
Publisher
Cambridge University Press (CUP)
ISSN
1431-9276
URL
http://dx.doi.org/10.1017/S1431927617002574
DOI
10.1017/s1431927617002574

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