Scanning TEM EBIC Imaging of Resistive Memory Switching ProcessesRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2018 Authors Regan, B. C., Lodico, Jared, Hubbard, William A. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 24 Issue 1 Pages 1806-1807 Publication Date 2018-08-01 Publisher Cambridge University Press (CUP) ISSN 1431-9276 URL http://dx.doi.org/10.1017/S1431927618009510 DOI 10.1017/s1431927618009510 PDF of Paper Previous Next