STROBE Publications

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2018
Authors: Regan, B. C.,

Lodico, Jared,

Hubbard, William A.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 24
Issue: 1
Pages: 1806-1807
Publication Date: 2018-08-01
Publisher: Cambridge University Press (CUP)
ISSN: 1431-9276
URL: http://dx.doi.org/10.1017/S1431927618009510
DOI: 10.1017/s1431927618009510