STROBE Publications

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2018
Authors
Regan, B. C.,
Lodico, Jared,
Hubbard, William A.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
24
Issue
1
Pages
1806-1807
Publication Date
2018-08-01
Publisher
Cambridge University Press (CUP)
ISSN
1431-9276
URL
http://dx.doi.org/10.1017/S1431927618009510
DOI
10.1017/s1431927618009510

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