Secondary electron emission current mapping for nanoscale thermometryRefereed Designation:Refereed Publication Type Journal Article Publication Year 2025 Authors Hubbard, William A, Mecklenburg, Matthew, Chan, Ho Leung, Regan, B C Journal Nanotechnology Short Title Nanotechnology Volume 36 Pages 265704 Publication Date 2025-6-24 Publisher IOP Publishing URL http://dx.doi.org/10.1088/1361-6528/ade445 DOI 10.1088/1361-6528/ade445 PDF of Paper Previous Next
