STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2017
Authors: Hubbard, William A.,

Joshi, Toyanath,

Mecklenburg, Matthew,

Zutter, Brian,

Borisov, Pavel,

Lederman, David,

Regan, B. C.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 23
Issue: 1
Pages: 1428-1429
Publication Date: 2017-07
Publisher: 1
ISSN: 1431-9276
URL: http://dx.doi.org/10.1017/S1431927617007802
DOI: 10.1017/s1431927617007802

STROBE Publications