STROBE Publications

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2017
Authors
Hubbard, William A.,
Joshi, Toyanath,
Mecklenburg, Matthew,
Zutter, Brian,
Borisov, Pavel,
Lederman, David,
Regan, B. C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
23
Issue
1
Pages
1428-1429
Publication Date
2017-07
Publisher
1
ISSN
1431-9276
URL
http://dx.doi.org/10.1017/S1431927617007802
DOI
10.1017/s1431927617007802

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