STROBE Publications

STEM Imaging with Beam-Induced Hole and Secondary Electron Currents

Refereed Designation:Refereed
Publication Type
Journal Article
Publication Year
2018
Authors
Hubbard, William A.,
Mecklenburg, Matthew,
Chan, Ho Leung,
Regan, B. C.
Journal
Physical Review Applied
Short Title
Phys. Rev. Applied
Volume
10
Issue
4
Publication Date
2018-10-29
Publisher
American Physical Society (APS)
URL
http://dx.doi.org/10.1103/PhysRevApplied.10.044066
DOI
10.1103/physrevapplied.10.044066

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