STEM Imaging with Beam-Induced Hole and Secondary Electron CurrentsRefereed Designation:Refereed Publication Type Journal Article Publication Year 2018 Authors Hubbard, William A., Mecklenburg, Matthew, Chan, Ho Leung, Regan, B. C. Journal Physical Review Applied Short Title Phys. Rev. Applied Volume 10 Issue 4 Publication Date 2018-10-29 Publisher American Physical Society (APS) URL http://dx.doi.org/10.1103/PhysRevApplied.10.044066 DOI 10.1103/physrevapplied.10.044066 PDF of Paper Previous Next
