STROBE-contributed + Non-Refereed – Page 2

51

Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory

P. Denham, P. Musumeci, Proceedings of the 12th International Particle Accelerator Conference, Brazil, (2021).

10.18429/JACOW-IPAC2021-TUPAB417

52

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

B. H. Savitzky, S. E. Zeltmann, L. A. Hughes, H. G. Brown, S. Zhao, P. M. Pelz, T. C. Pekin, E. S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M. T. Janish, M. M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K. C. Bustillo, P. Ercius, M. C. Scott, J. Ciston, A. M. Minor, C. Ophus, Microscopy and Microanalysis, 27, 712-743, (2021).

10.1017/s1431927621000477

53

Multiview Virtual Confocal Microscopy Through A Multimode Fiber

S. Singh, S. Labouesse, R. Piestun, 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), (2021).

10.1109/isbi48211.2021.9433950

54

Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction

K. M. Siddiqui, D. B. Durham, F. Cropp, S. Rajpurohit, C. Ophus, Y. Zhu, J. Carlstroem, C. Stavrakas, Z. Q. Mao, A. Raja, P. Musumeci, L. Z. Tan, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Phenomena and Nanophotonics XXV, (2021).

10.1117/12.2577621

55

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

B. Wang, M. Tanksalvala, Z. Zhang, Y. Esashi, N. Jenkins, M. Murnane, H. Kapteyn, C. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, (2021).

10.1117/12.2584728

56

Multibeam Electron Diffraction

X. Hong, S. E. Zeltmann, B. H. Savitzky, L. Rangel DaCosta, A. Müller, A. M. Minor, K. C. Bustillo, C. Ophus, Microscopy and Microanalysis, 27, 129-139, (2021).

10.1017/s1431927620024770

57

Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning

K. Kukula, D. Farmer, J. Duran, N. Majid, C. Chatterley, J. Jessing, Y. Li, 2021 IEEE 11th Annual Computing and Communication Workshop and Conference (CCWC), (2021).

10.1109/ccwc51732.2021.9375955

58

Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light

N. W. Jenkins, M. Tanksalvala, Y. Esashi, C. L. Porter, B. Wang, N. Horiguchi, M. N. Jacobs, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.ew3a.4

59

Generating Relativistic Intensities via Staged Pulse Compression in Dielectric Media

M. M. Stanfield, H. H. Allison, N. F. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.jm3a.22

60

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).

10.1117/12.2567540

61

Ultrafast structural dynamics of materials captured by relativistic electron bunches

K. Siddiqui, D. B. Durham, F. Cropp, A. Schmid, P. Musumeci, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Nonlinear Imaging and Spectroscopy VIII, (2020).

10.1117/12.2568320

62

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).

10.1017/s1431927620013604

63

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).

10.1017/s1431927620021510

64

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).

10.1017/s1431927620014749

65

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).

10.1017/s1431927620023880

66

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).

10.1017/s1431927620013756

67

Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography

J. Zhou, Y. Yang, Y. Yang, C. Ophus, F. Sun, A. Schmid, H. Zeng, P. Ercius, J. Miao, Microscopy and Microanalysis, 26, 1794-1796, (2020).

10.1017/s1431927620019364

68

Atomic Electron Tomography: Past, Present and Future

J. Miao, X. Tian, D. Kim, J. Zhou, Y. Yang, Y. Yang, Y. Yuan, C. Ophus, A. Schmid, S. Yang, F. Sun, C. Ciccarino, B. Duschatko, J. Idrobo, P. Narang, H. Zeng, P. Ercius, Microscopy and Microanalysis, 652-654, (2020).

10.1017/s143192762001541x

69

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 26, 904-905, (2020).

10.1017/s1431927620016268

70

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).

10.18260/1-2--34684

71

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).

10.1364/cleo_qels.2020.ff2c.7

72

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

73

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

74

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).

10.1364/fio.2019.jw4a.50

75

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).

10.18429/JACOW-NAPAC2019-MOPLH04

76

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

77

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).

10.1117/12.2531177

78

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).

10.1017/s1431927619009012

79

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).

10.1017/s1431927619011036

80

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

W. A. Hubbard, J. J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 256-257, (2019).

10.1017/s1431927619002010

81

Machine Learning for High Throughput HRTEM Analysis

C. Groschner, C. Choi, D. Nguyen, C. Ophus, M. Scott, Microscopy and Microanalysis, 25, 150-151, (2019).

10.1017/s143192761900148x

82

Probing thermal and acoustic dynamics of inverse silicon metallatices

C. C. Bevis, B. B. Abad, J. J. Knobloch, T. T. Frazer, A. A. Adak, J. J. Hernández-Charpak, H. H. Cheng, A. A. Grede, N. N. Giebink, N. N. Nova, T. T. Mallouk, P. P. Mahale, W. W. Chen, Y. Y. Xiong, I. I. Dabo, V. V. Crespi, D. D. Talreja, H. H. Kapteyn, V. V. Gopalan, J. J. Badding, M. M. Murnane, Microscopy and Microanalysis, 25, 2174-2175, (2019).

10.1017/s1431927619011607

83

Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

M. Mecklenburg, W. A. Hubbard, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 2354-2355, (2019).

10.1017/s1431927619012509

84

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

B. Wang, R. Karl, G. Mancini, J. Knobloch, T. Frazer, B. Mayor, M. Tanksalvala, C. Bevis, H. Kapteyn, J. N. Hernandez-Charpak, M. Murnane, Microscopy and Microanalysis, 25, 42-43, (2019).

10.1017/s1431927619000941

85

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

B. T. Zutter, H. Kim, W. A. Hubbard, D. Ren, J. J. Lodico, T. Chang, D. Huffaker, B. C. Regan, Microscopy and Microanalysis, 25, 1618-1619, (2019).

10.1017/s1431927619008821

86

Mapping Electronic State Changes with STEM EBIC

B. C. Regan, T. Joshi, J. J. Lodico, B. T. Zutter, H. Chan, M. Mecklenburg, D. Lederman, W. A. Hubbard, Microscopy and Microanalysis, 25, 1396-1397, (2019).

10.1017/s1431927619007712

87

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

H. Chan, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1846-1847, (2019).

10.1017/s1431927619009966

88

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Y. Esashi, C. L. Porter, M. Tanksalvala, G. P. Miley, N. Horiguchi, J. L. Knobloch, J. Zhou, R. M. Karl, P. Johnsen, C. S. Bevis, B. Wang, S. L. Cousin, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Microscopy and Microanalysis, 25, 116-117, (2019).

10.1017/s1431927619001314

89

A new approach for measuring of two-photon absorption using entangled photon pair excitation

A. Mikhaylov, M. D. Mazurek, K. M. Parzuchowski, T. Gerrits, M. J. Stevens, R. Jimenez, Rochester Conference on Coherence and Quantum Optics (CQO-11), (2019).

10.1364/cqo.2019.m5a.1

90

Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, N. Horiguchi, R. M. Karl, P. Johnsen, C. S. Bevis, N. W. Jenkins, B. Wang, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), (2019).

10.1364/cosi.2019.cw3a.6

91

High Performance Partial Coherent X-Ray Ptychography

P. Enfedaque, H. Chang, B. Enders, D. Shapiro, S. Marchesini, Computational Science – ICCS 2019, 11536, 46 - 59, (2019).

10.1007/978-3-030-22734-0_4

92

SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

C. Liao, Y. Lo, J. Zhou, A. Rana, C. S. Bevis, G. Gui, B. Enders, K. Cannon, D. Shapiro, C. Bennett, H. Kapteyn, R. Falcone, J. Miao, M. Murnane, Microscopy and Microanalysis, 25, 112-113, (2019).

10.1017/s1431927619001296

93

An Extreme Ultraviolet Spin Grating for Spatially Resolved, Hyperspectral Magnetic Dichroism Spectroscopies

N. J. Brooks, K. M. Dorney, J. L. Ellis, D. D. Hickstein, Q. L. Nguyen, C. Gentry, C. Hernández-García, D. Zusin, J. M. Shaw, G. S. Matthijs Jansen, S. Witte, H. C. Kapteyn, M. M. Murnane, Conference on Lasers and Electro-Optics, (2019).

10.1364/cleo_qels.2019.ff2c.7

94

Tabletop EUV Coherent Diffractive Imaging and Small Angle Scattering of Colloidal Crystals

M. Giulia F., R. Karl, S. Elisabeth, B. Charles, G. Dennis, T. Michael, R. Jennifer, A. Daniel, K. Henry, B. John, M. Thomas, M. Margaret, EPJ Web of Conferences, 205, 05015, (2019).

10.1051/epjconf/201920505015

95

Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams

B. Abad, T. Frazer, J. Knobloch, J. Hernández-Charpak, H. Cheng, A. Grede, N. Giebink, T. Mallouk, P. Mahale, W. Chen, Y. Xiong, I. Dabo, V. Crespi, D. Talreja, V. Gopalan, J. Badding, H. Kapteyn, M. Murnane, EPJ Web of Conferences, 205, 04006, (2019).

10.1051/epjconf/201920504006

96

Ultrafast dynamic imaging of thermal and acoustic dynamics in nanosystems using a tabletop high harmonic source

C. Bevis, K. r. Robert, G. F. Mancini, D. Gardner, E. Shanblatt, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Mayor, M. Tanksalvala, C. Porter, D. Adams, H. Kapteyn, M. M. Murnane, EPJ Web of Conferences, 205, 04005, (2019).

10.1051/epjconf/201920504005

97

Variable-wavelength tabletop-scale EUV ptychographic complex imaging reflectometry for 3D composition determination

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, R. Karl, P. Johnsen, N. W. Jenkins, C. S. Bevis, B. Wang, J. Thurston, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXIII, (2019).

10.1117/12.2516827

98

High-coherence relativistic electron probes for ultrafast structural dynamics

P. Musumeci, B. B. Griffin, D. Filippetto, F. Ji, A. Minor, F. Riminucci, D. B. Durham, X. Wang, M. Centurion, D. Slaughter, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1, 1, (2018).

10.1117/12.2321323

99

Dataflow at the COSMIC Beamline – Stream Processing and Supercomputing

B. Enders, K. Nowrouzi, H. Krishnan, S. Marchesini, J. Park, Y. Yu, D. A. Shapiro, Microscopy and Microanalysis, 24, 58-59, (2018).

10.1017/s1431927618012710

100

Nanoscale Visualization of Magnetic Contrasts with Soft X-ray Spectro-Ptychography at the Advanced Light Source

Y. Yu, R. Celestre, B. Enders, K. Nowrouzi, H. Padmore, T. Warwick, J. Jeong, D. A. Shapiro, Microscopy and Microanalysis, 24, 530-531, (2018).

10.1017/s143192761801485x

Publications

STROBE-contributed + Non-Refereed Publications

2021