STROBE-contributed + Non-Refereed Publications

Showing publications 51 – 100 of 117

2020

51

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).

10.1117/12.2567540

52

Ultrafast structural dynamics of materials captured by relativistic electron bunches

K. Siddiqui, D. B. Durham, F. Cropp, A. Schmid, P. Musumeci, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Nonlinear Imaging and Spectroscopy VIII, (2020).

10.1117/12.2568320

53

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 26, 904-905, (2020).

10.1017/s1431927620016268

54

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).

10.1017/s1431927620013604

55

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).

10.1017/s1431927620021510

56

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).

10.1017/s1431927620014749

57

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).

10.1017/s1431927620023880

58

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).

10.1017/s1431927620013756

59

Capturing the Atomic Coordinates of Surface and Subsurface Structure in 4D with Atomic Electron Tomography

J. Zhou, Y. Yang, Y. Yang, C. Ophus, F. Sun, A. Schmid, H. Zeng, P. Ercius, J. Miao, Microscopy and Microanalysis, 26, 1794-1796, (2020).

10.1017/s1431927620019364

60

Atomic Electron Tomography: Past, Present and Future

J. Miao, X. Tian, D. Kim, J. Zhou, Y. Yang, Y. Yang, Y. Yuan, C. Ophus, A. Schmid, S. Yang, F. Sun, C. Ciccarino, B. Duschatko, J. Idrobo, P. Narang, H. Zeng, P. Ercius, Microscopy and Microanalysis, 652-654, (2020).

10.1017/s143192762001541x

61

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).

10.18260/1-2--34684

62

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).

10.1364/cleo_qels.2020.ff2c.7

63

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

2019

64

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

65

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).

10.1364/fio.2019.jw4a.50

66

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).

10.18429/JACOW-NAPAC2019-MOPLH04

67

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

68

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).

10.1117/12.2531177

69

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Y. Esashi, C. L. Porter, M. Tanksalvala, G. P. Miley, N. Horiguchi, J. L. Knobloch, J. Zhou, R. M. Karl, P. Johnsen, C. S. Bevis, B. Wang, S. L. Cousin, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Microscopy and Microanalysis, 25, 116-117, (2019).

10.1017/s1431927619001314

70

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).

10.1017/s1431927619009012

71

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).

10.1017/s1431927619011036

72

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

W. A. Hubbard, J. J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 256-257, (2019).

10.1017/s1431927619002010

73

Machine Learning for High Throughput HRTEM Analysis

C. Groschner, C. Choi, D. Nguyen, C. Ophus, M. Scott, Microscopy and Microanalysis, 25, 150-151, (2019).

10.1017/s143192761900148x

74

Probing thermal and acoustic dynamics of inverse silicon metallatices

C. C. Bevis, B. B. Abad, J. J. Knobloch, T. T. Frazer, A. A. Adak, J. J. Hernández-Charpak, H. H. Cheng, A. A. Grede, N. N. Giebink, N. N. Nova, T. T. Mallouk, P. P. Mahale, W. W. Chen, Y. Y. Xiong, I. I. Dabo, V. V. Crespi, D. D. Talreja, H. H. Kapteyn, V. V. Gopalan, J. J. Badding, M. M. Murnane, Microscopy and Microanalysis, 25, 2174-2175, (2019).

10.1017/s1431927619011607

75

Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

M. Mecklenburg, W. A. Hubbard, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 2354-2355, (2019).

10.1017/s1431927619012509

76

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

B. Wang, R. Karl, G. Mancini, J. Knobloch, T. Frazer, B. Mayor, M. Tanksalvala, C. Bevis, H. Kapteyn, J. N. Hernandez-Charpak, M. Murnane, Microscopy and Microanalysis, 25, 42-43, (2019).

10.1017/s1431927619000941

77

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

B. T. Zutter, H. Kim, W. A. Hubbard, D. Ren, J. J. Lodico, T. Chang, D. Huffaker, B. C. Regan, Microscopy and Microanalysis, 25, 1618-1619, (2019).

10.1017/s1431927619008821

78

Mapping Electronic State Changes with STEM EBIC

B. C. Regan, T. Joshi, J. J. Lodico, B. T. Zutter, H. Chan, M. Mecklenburg, D. Lederman, W. A. Hubbard, Microscopy and Microanalysis, 25, 1396-1397, (2019).

10.1017/s1431927619007712

79

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

H. Chan, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1846-1847, (2019).

10.1017/s1431927619009966

80

A new approach for measuring of two-photon absorption using entangled photon pair excitation

A. Mikhaylov, M. D. Mazurek, K. M. Parzuchowski, T. Gerrits, M. J. Stevens, R. Jimenez, Rochester Conference on Coherence and Quantum Optics (CQO-11), (2019).

10.1364/cqo.2019.m5a.1

81

Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, N. Horiguchi, R. M. Karl, P. Johnsen, C. S. Bevis, N. W. Jenkins, B. Wang, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), (2019).

10.1364/cosi.2019.cw3a.6

82

High Performance Partial Coherent X-Ray Ptychography

P. Enfedaque, H. Chang, B. Enders, D. Shapiro, S. Marchesini, Computational Science – ICCS 2019, 11536, 46 - 59, (2019).

10.1007/978-3-030-22734-0_4

83

SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

C. Liao, Y. Lo, J. Zhou, A. Rana, C. S. Bevis, G. Gui, B. Enders, K. Cannon, D. Shapiro, C. Bennett, H. Kapteyn, R. Falcone, J. Miao, M. Murnane, Microscopy and Microanalysis, 25, 112-113, (2019).

10.1017/s1431927619001296

84

An Extreme Ultraviolet Spin Grating for Spatially Resolved, Hyperspectral Magnetic Dichroism Spectroscopies

N. J. Brooks, K. M. Dorney, J. L. Ellis, D. D. Hickstein, Q. L. Nguyen, C. Gentry, C. Hernández-García, D. Zusin, J. M. Shaw, G. S. Matthijs Jansen, S. Witte, H. C. Kapteyn, M. M. Murnane, Conference on Lasers and Electro-Optics, (2019).

10.1364/cleo_qels.2019.ff2c.7

85

Tabletop EUV Coherent Diffractive Imaging and Small Angle Scattering of Colloidal Crystals

M. Giulia F., R. Karl, S. Elisabeth, B. Charles, G. Dennis, T. Michael, R. Jennifer, A. Daniel, K. Henry, B. John, M. Thomas, M. Margaret, EPJ Web of Conferences, 205, 05015, (2019).

10.1051/epjconf/201920505015

86

Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams

B. Abad, T. Frazer, J. Knobloch, J. Hernández-Charpak, H. Cheng, A. Grede, N. Giebink, T. Mallouk, P. Mahale, W. Chen, Y. Xiong, I. Dabo, V. Crespi, D. Talreja, V. Gopalan, J. Badding, H. Kapteyn, M. Murnane, EPJ Web of Conferences, 205, 04006, (2019).

10.1051/epjconf/201920504006

87

Ultrafast dynamic imaging of thermal and acoustic dynamics in nanosystems using a tabletop high harmonic source

C. Bevis, K. r. Robert, G. F. Mancini, D. Gardner, E. Shanblatt, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Mayor, M. Tanksalvala, C. Porter, D. Adams, H. Kapteyn, M. M. Murnane, EPJ Web of Conferences, 205, 04005, (2019).

10.1051/epjconf/201920504005

88

Variable-wavelength tabletop-scale EUV ptychographic complex imaging reflectometry for 3D composition determination

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, R. Karl, P. Johnsen, N. W. Jenkins, C. S. Bevis, B. Wang, J. Thurston, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXIII, (2019).

10.1117/12.2516827

2018

89

High-coherence relativistic electron probes for ultrafast structural dynamics

P. Musumeci, B. B. Griffin, D. Filippetto, F. Ji, A. Minor, F. Riminucci, D. B. Durham, X. Wang, M. Centurion, D. Slaughter, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1, 1, (2018).

10.1117/12.2321323

90

Dataflow at the COSMIC Beamline – Stream Processing and Supercomputing

B. Enders, K. Nowrouzi, H. Krishnan, S. Marchesini, J. Park, Y. Yu, D. A. Shapiro, Microscopy and Microanalysis, 24, 58-59, (2018).

10.1017/s1431927618012710

91

Nanoscale Visualization of Magnetic Contrasts with Soft X-ray Spectro-Ptychography at the Advanced Light Source

Y. Yu, R. Celestre, B. Enders, K. Nowrouzi, H. Padmore, T. Warwick, J. Jeong, D. A. Shapiro, Microscopy and Microanalysis, 24, 530-531, (2018).

10.1017/s143192761801485x

92

The COSMIC Imaging Beamline at the Advanced Light Source: a new facility for spectro-microscopy of nano-materials

D. A. Shapiro, R. Celestre, B. Enders, J. Joseph, H. Krishnan, M. A. Marcus, K. Nowrouzi, H. Padmore, J. Park, A. Warwick, Y. Yu, Microscopy and Microanalysis, 24, 8-11, (2018).

10.1017/s1431927618012485

93

Scanning TEM Electron Beam Induced Current Imaging in Water

J. J. Lodico, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 24, 252-253, (2018).

10.1017/s1431927618001757

94

Electromigration of Copper in Lithographically-Defined Aluminum Nanowires

B. Zutter, M. Mecklenburg, S. Aloni, B. C. Regan, Microscopy and Microanalysis, 24, 2190-2191, (2018).

10.1017/s1431927618011431

95

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

B. C. Regan, J. Lodico, W. A. Hubbard, Microscopy and Microanalysis, 24, 1806-1807, (2018).

10.1017/s1431927618009510

96

Simultaneous second harmonic generation and Mueller Matrix polarimetry imaging of the rat cornea

I. Saytashev, N. Lopez, J. Chue-Sang, J. Ramella-Roman, Investigative Ophthalmology & Visual Science , 59, 5844, (2018).

97

Electron microscope based setup for single-shot 4D trace space reconstruction of bright electron beams

J. Giner Navarro, R. Aßmann, D. Cesar, B. Marchetti, D. Marx, P. Musumeci, Proceedings of the 9th International Particle Accelerator Conference, (2018).

10.18429/JACOW-IPAC2018-THPML106

98

Sub-wavelength Resolution, Wide Field-Of-View, and Quantitative 13nm Imaging in Reflection and Transmission with a Tabletop High Harmonic Source

C. Porter, M. Tanksalvala, D. Gardner, G. Mancini, M. Gerrity, G. Miley, X. Zhang, N. Horiguchi, E. Shanblatt, B. Galloway, Y. Esashi, C. Bevis, R. Karl, P. Johnson, D. Adams, H. Kapteyn, M. Murnane, High-Brightness Sources and Light-driven Interactions, (2018).

10.1364/euvxray.2018.et2b.2

99

Characterization and imaging of nanostructured materials using tabletop extreme ultraviolet light sources

R. Karl, G. F. Mancini, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Abad Mayor, M. Tanksalvala, C. L. Porter, C. S. Bevis, W. Chao, D. E. Adams, H. C. Kapteyn, M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).

10.1117/12.2297223

100

Complex EUV imaging reflectometry: spatially resolved 3D composition determination and dopant profiling with a tabletop 13nm source

R. Karl, P. Johnsen, D. E. Adams, H. C. Kapteyn, M. M. Murnane, N. Horiguchi, C. L. Porter, M. Tanksalvala, M. Gerrity, G. P. Miley, X. Zhang, C. S. Bevis, Y. Esashi, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).

10.1117/12.2297464