STROBE-contributed + Non-Refereed – Page 2

51

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

B. Zutter, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 26, 152-154, (2020).

10.1017/s1431927620013604

52

Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Y. Deng, J. Ciston, K. Bustillo, C. Ophus, R. Zhang, C. Song, C. Gammer, A. Minor, Microscopy and Microanalysis, 26, 2418-2419, (2020).

10.1017/s1431927620021510

53

Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning

P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus, Microscopy and Microanalysis, 26, 462-464, (2020).

10.1017/s1431927620014749

54

STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

W. Hubbard, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 26, 3124-3125, (2020).

10.1017/s1431927620023880

55

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

M. Mecklenburg, F. Shaapur, W. Hubbard, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 194-195, (2020).

10.1017/s1431927620013756

56

Fostering Inclusion and Teaching Equity in a Modern Physics for Engineers Course

J. Hoehn, N. Finkelstein, 2020 ASEE Virtual Annual Conference Content Access Proceedings, (2020).

10.18260/1-2--34684

57

Few Cycle EUV Continuum Generation via Thin Film Compression

M. M. Stanfield, H. H. Allison, N. N. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, Conference on Lasers and Electro-Optics, (2020).

10.1364/cleo_qels.2020.ff2c.7

58

High-fidelity complex EUV imaging reflectometry for depth-dependent composition determination

Y. Esashi, M. Tanksalvala, C. Porter, N. Jenkins, Z. Zhang, B. Wang, G. P. Miley, J. Knobloch, N. Horiguchi, J. Zhou, E. Hostler, C. Bevis, R. M. Karl, P. Johnsen, M. Jacobs, S. Cousin, C. Liao, J. Miao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, SPIE Advanced Lithography: Metrology, Inspection, and Process Control for Microlithography XXXIV, (2020).

59

Design for Hyres cathode nanotip electron source

R. M. Hessami, A. A. Amhaz, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

60

Characterizing Two-Photon Absorption With g(2)

M. D. Mazurek, A. Mikhaylov, K. Parzuchowski, D. J. Lum, L. K. Shalm, C. Drago, J. E. Sipe, S. Nam, M. T. Cicerone, C. H. Camp, R. Jimenez, T. T. Gerrits, M. J. Stevens, Frontiers in Optics + Laser Science APS/DLS, (2019).

10.1364/fio.2019.jw4a.50

61

Design for HyRES Cathode Nanotip Electron Source

R. Hessami, A. Amhaz, P. Musumeci, Proceedings of the North American Particle Accelerator Conference, USA, (2019).

10.18429/JACOW-NAPAC2019-MOPLH04

62

Progress in Time-Resolved MeV electron microscopy at UCLA

P. P. Denham, N. N. Burger, D. D. Cesar, D. D. Dang, P. P. Musumeci, 2019 North American Particle Accelerator Conference, (2019).

63

Correlative conventional scanning and ptychographic soft x-ray microscopy

J. Zhao, K. Nowrouzi, R. S. Celestre, M. A. Marcus, Y. Yu, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods IV, 11112, (2019).

10.1117/12.2531177

64

Mapping Electronic State Changes with STEM EBIC

B. C. Regan, T. Joshi, J. J. Lodico, B. T. Zutter, H. Chan, M. Mecklenburg, D. Lederman, W. A. Hubbard, Microscopy and Microanalysis, 25, 1396-1397, (2019).

10.1017/s1431927619007712

65

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

H. Chan, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1846-1847, (2019).

10.1017/s1431927619009966

66

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Y. Esashi, C. L. Porter, M. Tanksalvala, G. P. Miley, N. Horiguchi, J. L. Knobloch, J. Zhou, R. M. Karl, P. Johnsen, C. S. Bevis, B. Wang, S. L. Cousin, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Microscopy and Microanalysis, 25, 116-117, (2019).

10.1017/s1431927619001314

67

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

M. Mecklenburg, W. A. Hubbard, J. J. Lodico, B. C. Regan, Microscopy and Microanalysis, 25, 1656-1657, (2019).

10.1017/s1431927619009012

68

STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling

J. J. Lodico, M. Mecklenburg, H. Chan, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 25, 2060-2061, (2019).

10.1017/s1431927619011036

69

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

W. A. Hubbard, J. J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 256-257, (2019).

10.1017/s1431927619002010

70

Machine Learning for High Throughput HRTEM Analysis

C. Groschner, C. Choi, D. Nguyen, C. Ophus, M. Scott, Microscopy and Microanalysis, 25, 150-151, (2019).

10.1017/s143192761900148x

71

Probing thermal and acoustic dynamics of inverse silicon metallatices

C. C. Bevis, B. B. Abad, J. J. Knobloch, T. T. Frazer, A. A. Adak, J. J. Hernández-Charpak, H. H. Cheng, A. A. Grede, N. N. Giebink, N. N. Nova, T. T. Mallouk, P. P. Mahale, W. W. Chen, Y. Y. Xiong, I. I. Dabo, V. V. Crespi, D. D. Talreja, H. H. Kapteyn, V. V. Gopalan, J. J. Badding, M. M. Murnane, Microscopy and Microanalysis, 25, 2174-2175, (2019).

10.1017/s1431927619011607

72

Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

M. Mecklenburg, W. A. Hubbard, H. Chan, B. C. Regan, Microscopy and Microanalysis, 25, 2354-2355, (2019).

10.1017/s1431927619012509

73

Full-Field Stroboscopic Imaging of Acoustic and Thermal Dynamics in Isolated Nanostructures Using Tabletop EUV Coherent Imaging

B. Wang, R. Karl, G. Mancini, J. Knobloch, T. Frazer, B. Mayor, M. Tanksalvala, C. Bevis, H. Kapteyn, J. N. Hernandez-Charpak, M. Murnane, Microscopy and Microanalysis, 25, 42-43, (2019).

10.1017/s1431927619000941

74

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

B. T. Zutter, H. Kim, W. A. Hubbard, D. Ren, J. J. Lodico, T. Chang, D. Huffaker, B. C. Regan, Microscopy and Microanalysis, 25, 1618-1619, (2019).

10.1017/s1431927619008821

75

A new approach for measuring of two-photon absorption using entangled photon pair excitation

A. Mikhaylov, M. D. Mazurek, K. M. Parzuchowski, T. Gerrits, M. J. Stevens, R. Jimenez, Rochester Conference on Coherence and Quantum Optics (CQO-11), (2019).

10.1364/cqo.2019.m5a.1

76

Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, N. Horiguchi, R. M. Karl, P. Johnsen, C. S. Bevis, N. W. Jenkins, B. Wang, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), (2019).

10.1364/cosi.2019.cw3a.6

77

High Performance Partial Coherent X-Ray Ptychography

P. Enfedaque, H. Chang, B. Enders, D. Shapiro, S. Marchesini, Computational Science – ICCS 2019, 11536, 46 - 59, (2019).

10.1007/978-3-030-22734-0_4

78

An Extreme Ultraviolet Spin Grating for Spatially Resolved, Hyperspectral Magnetic Dichroism Spectroscopies

N. J. Brooks, K. M. Dorney, J. L. Ellis, D. D. Hickstein, Q. L. Nguyen, C. Gentry, C. Hernández-García, D. Zusin, J. M. Shaw, G. S. Matthijs Jansen, S. Witte, H. C. Kapteyn, M. M. Murnane, Conference on Lasers and Electro-Optics, (2019).

10.1364/cleo_qels.2019.ff2c.7

79

SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

C. Liao, Y. Lo, J. Zhou, A. Rana, C. S. Bevis, G. Gui, B. Enders, K. Cannon, D. Shapiro, C. Bennett, H. Kapteyn, R. Falcone, J. Miao, M. Murnane, Microscopy and Microanalysis, 25, 112-113, (2019).

10.1017/s1431927619001296

80

Tabletop EUV Coherent Diffractive Imaging and Small Angle Scattering of Colloidal Crystals

M. Giulia F., R. Karl, S. Elisabeth, B. Charles, G. Dennis, T. Michael, R. Jennifer, A. Daniel, K. Henry, B. John, M. Thomas, M. Margaret, EPJ Web of Conferences, 205, 05015, (2019).

10.1051/epjconf/201920505015

81

Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams

B. Abad, T. Frazer, J. Knobloch, J. Hernández-Charpak, H. Cheng, A. Grede, N. Giebink, T. Mallouk, P. Mahale, W. Chen, Y. Xiong, I. Dabo, V. Crespi, D. Talreja, V. Gopalan, J. Badding, H. Kapteyn, M. Murnane, EPJ Web of Conferences, 205, 04006, (2019).

10.1051/epjconf/201920504006

82

Ultrafast dynamic imaging of thermal and acoustic dynamics in nanosystems using a tabletop high harmonic source

C. Bevis, K. r. Robert, G. F. Mancini, D. Gardner, E. Shanblatt, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Mayor, M. Tanksalvala, C. Porter, D. Adams, H. Kapteyn, M. M. Murnane, EPJ Web of Conferences, 205, 04005, (2019).

10.1051/epjconf/201920504005

83

Variable-wavelength tabletop-scale EUV ptychographic complex imaging reflectometry for 3D composition determination

M. Tanksalvala, C. L. Porter, Y. Esashi, G. P. Miley, R. Karl, P. Johnsen, N. W. Jenkins, C. S. Bevis, B. Wang, J. Thurston, X. Zhang, S. L. Cousin, D. E. Adams, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXIII, (2019).

10.1117/12.2516827

84

High-coherence relativistic electron probes for ultrafast structural dynamics

P. Musumeci, B. B. Griffin, D. Filippetto, F. Ji, A. Minor, F. Riminucci, D. B. Durham, X. Wang, M. Centurion, D. Slaughter, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1, 1, (2018).

10.1117/12.2321323

85

Dataflow at the COSMIC Beamline – Stream Processing and Supercomputing

B. Enders, K. Nowrouzi, H. Krishnan, S. Marchesini, J. Park, Y. Yu, D. A. Shapiro, Microscopy and Microanalysis, 24, 58-59, (2018).

10.1017/s1431927618012710

86

Nanoscale Visualization of Magnetic Contrasts with Soft X-ray Spectro-Ptychography at the Advanced Light Source

Y. Yu, R. Celestre, B. Enders, K. Nowrouzi, H. Padmore, T. Warwick, J. Jeong, D. A. Shapiro, Microscopy and Microanalysis, 24, 530-531, (2018).

10.1017/s143192761801485x

87

The COSMIC Imaging Beamline at the Advanced Light Source: a new facility for spectro-microscopy of nano-materials

D. A. Shapiro, R. Celestre, B. Enders, J. Joseph, H. Krishnan, M. A. Marcus, K. Nowrouzi, H. Padmore, J. Park, A. Warwick, Y. Yu, Microscopy and Microanalysis, 24, 8-11, (2018).

10.1017/s1431927618012485

88

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

B. C. Regan, J. Lodico, W. A. Hubbard, Microscopy and Microanalysis, 24, 1806-1807, (2018).

10.1017/s1431927618009510

89

Scanning TEM Electron Beam Induced Current Imaging in Water

J. J. Lodico, W. A. Hubbard, B. C. Regan, Microscopy and Microanalysis, 24, 252-253, (2018).

10.1017/s1431927618001757

90

Electromigration of Copper in Lithographically-Defined Aluminum Nanowires

B. Zutter, M. Mecklenburg, S. Aloni, B. C. Regan, Microscopy and Microanalysis, 24, 2190-2191, (2018).

10.1017/s1431927618011431

91

Simultaneous second harmonic generation and Mueller Matrix polarimetry imaging of the rat cornea

I. Saytashev, N. Lopez, J. Chue-Sang, J. Ramella-Roman, Investigative Ophthalmology & Visual Science , 59, 5844, (2018).

92

Electron microscope based setup for single-shot 4D trace space reconstruction of bright electron beams

J. Giner Navarro, R. Aßmann, D. Cesar, B. Marchetti, D. Marx, P. Musumeci, Proceedings of the 9th International Particle Accelerator Conference, (2018).

10.18429/JACOW-IPAC2018-THPML106

93

Sub-wavelength Resolution, Wide Field-Of-View, and Quantitative 13nm Imaging in Reflection and Transmission with a Tabletop High Harmonic Source

C. Porter, M. Tanksalvala, D. Gardner, G. Mancini, M. Gerrity, G. Miley, X. Zhang, N. Horiguchi, E. Shanblatt, B. Galloway, Y. Esashi, C. Bevis, R. Karl, P. Johnson, D. Adams, H. Kapteyn, M. Murnane, High-Brightness Sources and Light-driven Interactions, (2018).

10.1364/euvxray.2018.et2b.2

94

Characterization and imaging of nanostructured materials using tabletop extreme ultraviolet light sources

R. Karl, G. F. Mancini, J. Knobloch, T. Frazer, J. N. Hernandez-Charpak, B. Abad Mayor, M. Tanksalvala, C. L. Porter, C. S. Bevis, W. Chao, D. E. Adams, H. C. Kapteyn, M. Murnane, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).

10.1117/12.2297223

95

Complex EUV imaging reflectometry: spatially resolved 3D composition determination and dopant profiling with a tabletop 13nm source

R. Karl, P. Johnsen, D. E. Adams, H. C. Kapteyn, M. M. Murnane, N. Horiguchi, C. L. Porter, M. Tanksalvala, M. Gerrity, G. P. Miley, X. Zhang, C. S. Bevis, Y. Esashi, Metrology, Inspection, and Process Control for Microlithography XXXII, (2018).

10.1117/12.2297464

96

Multi-model imaging of the interaction of nanomaterials with cells

J. Miao, IUCrJ, 5, 122-123, (2018).

10.1107/s2052252518003548

97

Multiphoton microscopy of ECM proteins in baboon aortic leaflet

M. Gonzalez, I. Saytashev, B. Gonzalez, A. Pinero, M. Perez, S. Ramaswamy, J. C. Ramella-Roman, C. Luna, Diagnostic and Therapeutic Applications of Light in Cardiology 2018, (2018).

10.1117/12.2291024

98

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

W. A. Hubbard, M. Mecklenburg, H. Chan, B. C. Regan, Microscopy and Microanalysis, 24, 1846-1847, (2018).

10.1017/s1431927618009716

99

First Demonstration of Sub-Wavelength Imaging at Short Wavelengths

D. F. Gardner, E. R. Shanblatt, M. Tanksalvala, X. Zhang, B. R. Galloway, C. L. Porter, R. Karl, C. Bevis, B. Zhang, M. D. Seaberg, G. F. Mancini, D. E. Adams, H. C. Kapteyn, M. M. Murnane, Frontiers in Optics 2017, (2017).

10.1364/ls.2017.lm3f.4

100

Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging

W. A. Hubbard, E. R. White, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 23, 1506-1507, (2017).

10.1017/s1431927617008194

Publications

STROBE-contributed + Non-Refereed Publications

2020