Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2018
Authors: Hubbard, William A.,

Mecklenburg, Matthew,

Chan, Ho Leung,

Regan, B. C.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 24
Pages: 1846-1847
Publication Date: 2018-08
Publisher: Cambridge University Press (CUP)
URL: http://dx.doi.org/10.1017/S1431927618009716
DOI: 10.1017/s1431927618009716

STROBE Publications