Single-shot ionization-based monitor for pulsed electron beams

Refereed Designation:Refereed
Publication Type
Journal Article
Publication Year
2024
Authors
Denham, P.,
Ody, A.,
Musumeci, P.,
Burger, N.,
Cook, N.,
Andonian, G.
Journal
Physical Review Applied
Short Title
Phys. Rev. Applied
Volume
22
Pages
064033
Publication Date
2024-12-10
Publisher
American Physical Society (APS)
URL
http://dx.doi.org/10.1103/PhysRevApplied.22.064033
DOI
10.1103/physrevapplied.22.064033

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