Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEMRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2020 Authors Zutter, Brian, Mecklenburg, Matthew, Chan, Ho Leung, Regan, B. C. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 26 Pages 152-154 Publication Date 2020-07-30 Publisher Cambridge University Press (CUP) URL http://dx.doi.org/10.1017/S1431927620013604 DOI 10.1017/s1431927620013604 PDF of Paper Previous Next