Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2020
Authors: Zutter, Brian,

Mecklenburg, Matthew,

Chan, Ho Leung,

Regan, B. C.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 26
Pages: 152-154
Publication Date: 2020-07-30
Publisher: Cambridge University Press (CUP)
URL: http://dx.doi.org/10.1017/S1431927620013604
DOI: 10.1017/s1431927620013604

STROBE Publications