Detailed In Situ Observations of Electromigration in Aluminum WiresRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2017 Authors Mecklenburg, Matthew, Zutter, Brian, Hubbard, William A., Aloni, Shaul, Regan, B. C. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 23 Issue 1 Pages 1450-1451 Publication Date 2017-08-04 Publisher Cambridge University Press (CUP) URL http://dx.doi.org/10.1017/S1431927617007917 DOI 10.1017/s1431927617007917 PDF of Paper Previous Next
