Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2017
Authors: Hubbard, William A.,

White, Edward. R.,

Mecklenburg, Matthew,

Regan, B. C.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 23
Issue: 1
Pages: 1506-1507
Publication Date: 2017-08-04
Publisher: Cambridge University Press (CUP)
ISSN: 1431-9276
URL: http://dx.doi.org/10.1017/S1431927617008194
DOI: 10.1017/s1431927617008194

STROBE Publications