Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patternsRefereed Designation:Refereed Publication Type Journal Article Publication Year 2022 Authors Munshi, Joydeep, Rakowski, Alexander, Savitzky, Benjamin H., Zeltmann, Steven E., Ciston, Jim, Henderson, Matthew, Cholia, Shreyas, Minor, Andrew M., Chan, Maria K. Y., Ophus, Colin Journal npj Computational Materials Short Title npj Comput Mater Volume 8 Issue 254 Publication Date 2022-12-14 Publisher Springer Science and Business Media LLC URL http://dx.doi.org/10.1038/s41524-022-00939-9 DOI 10.1038/s41524-022-00939-9 PDF of Paper Previous Next
