In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2021
Authors
Chan, Ho Leung,
Mecklenburg, Matthew,
Hubbard, William,
Lodico, Jared,
Zutter, Brian,
Regan, B. C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
27
Issue
S1
Pages
168-169
Publication Date
2021-7-30
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S1431927621001203
DOI
10.1017/s1431927621001203

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