In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal StressRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2021 Authors Chan, Ho Leung, Mecklenburg, Matthew, Hubbard, William, Lodico, Jared, Zutter, Brian, Regan, B. C. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 27 Issue S1 Pages 168-169 Publication Date 2021-7-30 Publisher Cambridge University Press (CUP) URL http://dx.doi.org/10.1017/S1431927621001203 DOI 10.1017/s1431927621001203 PDF of Paper Previous Next