Mapping Charge Recombination and the Effect of Point-Defect Insertion in GaAs Nanowire Heterojunctions

Refereed

Publication Type: Journal Article
Publication Year: 2021
Authors: Zutter, Brian T.,

Kim, Hyunseok,

Hubbard, William A.,

Ren, Dingkun,

Mecklenburg, Matthew,

Huffaker, Diana,

Regan, B.C.
Journal: Physical Review Applied
Short Title: Phys. Rev. Applied
Volume: 16
Pages: 044030
Publication Date: 2021-10-18
Publisher: American Physical Society (APS)
URL: http://dx.doi.org/10.1103/PhysRevApplied.16.044030
DOI: 10.1103/physrevapplied.16.044030

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