Multi-Modal Extreme-Ultraviolet Reflectometer: Solving Inverse Problems in Nanoscale Metrology

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2024
Authors
Shao, Yunzhe,
Jenkins, Nicholas W.,
Klein, Clay,
Li, Yunhao,
Esashi, Yuka,
Tanksalvala, Michael,
Murnane, Margaret M.,
Kapteyn, Henry C.
Journal
Frontiers in Optics + Laser Science 2024 (FiO, LS)
Volume
FTu1B.3
Pages
FTu1B.3
Publication Date
2024-09
Publisher
Optica Publishing Group
URL
http://dx.doi.org/10.1364/FIO.2024.FTu1B.3
DOI
10.1364/fio.2024.ftu1b.3

PDF of Paper