Multi-Modal Extreme-Ultraviolet Reflectometer: Solving Inverse Problems in Nanoscale MetrologyRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2024 Authors Shao, Yunzhe, Jenkins, Nicholas W., Klein, Clay, Li, Yunhao, Esashi, Yuka, Tanksalvala, Michael, Murnane, Margaret M., Kapteyn, Henry C. Journal Frontiers in Optics + Laser Science 2024 (FiO, LS) Volume FTu1B.3 Pages FTu1B.3 Publication Date 2024-09 Publisher Optica Publishing Group URL http://dx.doi.org/10.1364/FIO.2024.FTu1B.3 DOI 10.1364/fio.2024.ftu1b.3 PDF of Paper Previous Next