Patterned probes for high precision 4D-STEM bragg measurementsRefereed Designation:Refereed Publication Type Journal Article Publication Year 2020 Authors Zeltmann, Steven E, Müller, Alexander, Bustillo, Karen C, Savitzky, Benjamin, Hughes, Lauren, Minor, Andrew M, Ophus, Colin Journal Ultramicroscopy Short Title Ultramicroscopy Volume 209 Pages 112890 Publication Date 2020-02 Publisher 1 URL http://dx.doi.org/10.1016/j.ultramic.2019.112890 DOI 10.1016/j.ultramic.2019.112890 PDF of Paper Previous Next
