Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEM

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2020
Authors: Deng, Yu,

Ciston, Jim,

Bustillo, Karen,

Ophus, Colin,

Zhang, Ruopeng,

Song, Chengyu,

Gammer, Christoph,

Minor, Andrew
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 26
Issue: 2
Pages: 2418-2419
Publication Date: 2020-07-30
Publisher: Cambridge University Press (CUP)
URL: http://dx.doi.org/10.1017/S1431927620021510
DOI: 10.1017/s1431927620021510

STROBE Publications