Probing Mobile-point-defect-mediated Nanodomain Evolutions in Ferroelastic-ferroelectrics Under High Stress with In-situ TEMRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2020 Authors Deng, Yu, Ciston, Jim, Bustillo, Karen, Ophus, Colin, Zhang, Ruopeng, Song, Chengyu, Gammer, Christoph, Minor, Andrew Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 26 Issue 2 Pages 2418-2419 Publication Date 2020-07-30 Publisher Cambridge University Press (CUP) URL http://dx.doi.org/10.1017/S1431927620021510 DOI 10.1017/s1431927620021510 PDF of Paper Previous Next