STROBE Publications

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2018
Authors
Hubbard, William A.,
Mecklenburg, Matthew,
Chan, Ho Leung,
Regan, B. C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
24
Pages
1846-1847
Publication Date
2018-08
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S1431927618009716
DOI
10.1017/s1431927618009716

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