Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

Non-refereed/STROBE-contributed

Publication Type: Journal Article
Publication Year: 2019
Authors: Mecklenburg, Matthew,

Hubbard, William A.,

Lodico, Jared J.,

Regan, B. C.
Journal: Microscopy and Microanalysis
Short Title: Microsc Microanal
Volume: 25
Issue: S2
Pages: 1656-1657
Publication Date: 2019-08-05
Publisher: Cambridge University Press (CUP)
ISSN: 1431-9276
URL: http://dx.doi.org/10.1017/S1431927619009012
DOI: 10.1017/s1431927619009012

STROBE Publications