Single-shot ionization-based monitor for pulsed electron beamsRefereed Designation:Refereed Publication Type Journal Article Publication Year 2024 Authors Denham, P., Ody, A., Musumeci, P., Burger, N., Cook, N., Andonian, G. Journal Physical Review Applied Short Title Phys. Rev. Applied Volume 22 Pages 064033 Publication Date 2024-12-10 Publisher American Physical Society (APS) URL http://dx.doi.org/10.1103/PhysRevApplied.22.064033 DOI 10.1103/physrevapplied.22.064033 PDF of Paper Previous Next