STROBE-contributed + Non-Refereed

1

Understanding Ferroelectric Polarization in Hafnium Zirconium Oxide

B. Regan, Y. Chen, T. O’Neill, S. Fields, M. Lenox, J. Ihlefeld, W. Hubbard, H. Chan, Microscopy and Microanalysis, 30, ozae044.679, (2024).

10.1093/mam/ozae044.679

2

Mapping Moiré Potentials with STEM EBIC Imaging

T. O’Neill, E. Elias, Y. Chen, H. Chan, Q. Shi, B. Regan, Microscopy and Microanalysis, 30, ozae044.774, (2024).

10.1093/mam/ozae044.774

3

Detecting Chemical Shifts with Energy Dispersive Spectroscopy

Y. Chen, R. Jin, Y. Heffes, B. Zutter, T. O’Neill, J. Lodico, B. Regan, M. Mecklenburg, Microscopy and Microanalysis, 30, ozae044.143, (2024).

10.1093/mam/ozae044.143

4

Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping

H. Chan, Y. Chen, T. O’Neill, S. Fields, M. Lenox, J. Ihlefeld, W. Hubbard, B. Regan, Microscopy and Microanalysis, 30, ozae044.074, (2024).

10.1093/mam/ozae044.074

5

Multi-Modal Extreme-Ultraviolet Reflectometer: Solving Inverse Problems in Nanostructure Metrology

Y. Shao, N. W. Jenkins, C. Klein, Y. Li, Y. Esashi, M. M. Murnane, H. C. Kapteyn, M. Tanksalvala, 2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA), 1-5, (2024).

10.1109/cisa60639.2024.10576406

6

EUV scatterometry: low-dose characterization of polymer-based metamaterials

N. W. Jenkins, Y. Esashi, Y. Shao, M. Tanksalvala, H. C. Kapteyn, M. M. Murnane, M. Atkinson, Metrology, Inspection, and Process Control XXXVIII, 12955, 37, (2024).

10.1117/12.3009911

7

Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy

S. Ribet, S. Zeltmann, K. Bustillo, R. Dhall, P. Denes, A. Minor, R. dos Reis, V. Dravid, C. Ophus, Microscopy and Microanalysis, 29, 1950-1960, (2023).

10.1093/micmic/ozad111

8

Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using extreme ultraviolet, coherent diffractive imaging reflectometry

M. Tanksalvala, Y. Esashi, C. L. Porter, N. W. Jenkins, B. Wang, Z. Zhang, G. P. Miley, N. Horiguchi, S. Yazdi, C. Liao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, Frontiers in Optics + Laser Science 2023 (FiO, LS), LM1F.4, (2023).

10.1364/ls.2023.lm1f.4

9

Soft x-ray vector ptycho-tomography: a new quantitative vector nanoimaging method for spin textures in 3D

C. Liao, A. Rana, E. Iacocca, J. Zou, M. Pham, X. Lu, E. Cating Subramanian, Y. Lo, S. Ryan, C. Bevis, R. Karl, A. Glaid, J. Rable, P. Mahale, J. Hirst, T. Ostler, W. Liu, C. O’Leary, Y. Yu, K. Bustillo, H. Ohldag, D. Shapiro, S. Yazdi, T. Mallouk, S. J. Osher, H. Kapteyn, V. Crespi, J. V. Badding, Y. Tserkovnyak, M. M. Murnane, J. Miao, Spintronics XVI, 12656, 13, (2023).

10.1117/12.2679845

10

Spectrum Imaging of a Lithium Ion Battery Anode Using Thin Fluid Cells

M. Mecklenburg, J. Lodico, H. Chan, Y. Chen, X. Ling, B. Regan, Microscopy and Microanalysis, 29, 672-673, (2023).

10.1093/micmic/ozad067.331

11

Observation of Simultaneous Successive Twinning Using Atomic Electron Tomography

P. Pelz, C. Groschner, A. Bruefach, C. Ophus, M. Scott, Microscopy and Microanalysis, 29, 707-708, (2023).

10.1093/micmic/ozad067.348

12

Mapping Conductivity in the TEM with SEEBIC

W. Hubbard, H. Chan, B. Regan, Microscopy and Microanalysis, 29, 1851-1852, (2023).

10.1093/micmic/ozad067.956

13

Emission-Based Temperature Mapping with STEM EBIC

W. Hubbard, M. Mecklenburg, H. Chan, B. Regan, Microscopy and Microanalysis, 29, 1608-1609, (2023).

10.1093/micmic/ozad067.825

14

Elucidating the Role of Cr Migration in Ni-Cr Exposed to Molten FLiNaK via STEM-Based Methods

S. Mills, R. Hayes, N. Bieberdorf, S. Zeltmann, A. Kennedy, R. Scarlat, M. Asta, A. Minor, Microscopy and Microanalysis, 29, 1505-1506, (2023).

10.1093/micmic/ozad067.774

15

Beyond MicroED: Ab Initio Structure Elucidation using 4D-STEM

A. Saha, A. Pattison, M. Mecklenburg, A. Brewster, P. Ercius, J. Rodriguez, Microscopy and Microanalysis, 29, 309-310, (2023).

10.1093/micmic/ozad067.143

16

Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model

S. Zeltmann, S. Hsu, H. Brown, S. Susarla, A. Minor, C. Ophus, Microscopy and Microanalysis, 29, 256-257, (2023).

10.1093/micmic/ozad067.115

17

Phase Diversity in Ptychographic Reconstructions with a Programmable Phase Plate

S. Ribet, S. Zeltmann, G. Varnavides, R. dos Reis, V. Dravid, C. Ophus, Microscopy and Microanalysis, 29, 296-297, (2023).

10.1093/micmic/ozad067.137

18

Robust and reliable actinic ptychographic imaging of highly periodic structures in EUV photomasks

B. Wang, N. Brooks, M. Tanksalvala, Y. Esashi, N. Jenkins, P. Johnsen, I. Binnie, G. Gui, Y. Shao, M. Murnane, H. Kapteyn, Photomask Technology 2022, 12293, 122930D, (2022).

10.1117/12.2641726

19

High-Resolution Conductivity Mapping with STEM EBIC

W. Hubbard, H. Chan, B. C. Regan, International Symposium for Testing and Failure Analysis, istfa2022p0251, 251-253, (2022).

10.31399/asm.cp.istfa2022p0251

20

Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

R. Jin, B. Zutter, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 2068-2069, (2021).

10.1017/s1431927621007480

21

A Multislice Approach to Quantify Laser-Induced Lattice Temperature from Ultrafast Electron Diffraction Measurements of Single-Crystal Films

D. Durham, K. Siddiqui, C. Ophus, A. Minor, D. Filippetto, Microscopy and Microanalysis, 28, 888-890, (2022).

10.1017/s1431927622003920

22

Separation of EBIC Modes with Two-Channel STEM EBIC

W. A. Hubbard, H. Chan, M. Mecklenburg, B. C. Regan, Microscopy and Microanalysis, 28, 2508-2509, (2022).

10.1017/s143192762200959x

23

Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC

H. Chan, S. S. Fields, T. O'Neill, Y. Chen, W. A. Hubbard, J. F. Ihlefeld, B. C. Regan, Microscopy and Microanalysis, 28, 2270-2271, (2022).

10.1017/s1431927622008728

24

In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution

Y. Chen, H. Chan, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 2314-2315, (2022).

10.1017/s1431927622008893

25

Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction

Y. Chen, J. J. Lodico, X. Ling, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 28, 576-577, (2022).

10.1017/s1431927622002884

26

Commissioning of an X-Band Cavity for Longitudinal Phase Space Linearization at UCLA PEGASUS Laboratory

P. Denham, P. Musumeci, A. Ody, Proceedings of the 13th International Particle Accelerator Conference, Thailand, (2022).

10.18429/JACOW-IPAC2022-THPOST040

27

Direct observation of topological magnetic monopoles using soft x-ray vector ptychography at 10 nm resolution

C. Liao, A. Rana, E. Iacocca, J. Zou, M. Pham, X. Lu, E. Subramanian, Y. Lo, S. A. Ryan, C. S. Bevis, R. M. Karl, A. J. Glaid, J. Rable, P. Mahale, J. Hirst, T. Ostler, W. Liu, C. M. O'Leary, Y. Yu, K. Bustillo, H. Ohldag, D. A. Shapiro, S. Yazdi, T. E. Mallouk, S. J. Osher, H. C. Kapteyn, V. H. Crespi, J. V. Badding, Y. Tserkovnyak, J. Miao, M. M. Murnane, Optica High-brightness Sources and Light-driven Interactions Congress 2022, JTh6A.3, (2022).

10.1364/euvxray.2022.jth6a.3

28

Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

C. Ophus, S. E. Zeltmann, A. Bruefach, A. Rakowski, B. H. Savitzky, A. M. Minor, M. C. Scott, Microscopy and Microanalysis, 1-14, (2022).

10.1017/s1431927622000101

29

4D Beam Tomography at the UCLA Pegasus Laboratory

V. Guo, P. Denham, P. Musumeci, A. Ody, Y. Park, Proceedings of the 10th International Beam Instrumentation Conference, Rep. of Korea, (2021).

10.18429/JACOW-IBIC2021-TUPP15

30

Soft x-ray linear dichroic ptychography: the study of crystal orientation in biominerals

V. J. Schoeppler, M. A. Marcus, Y. Yu, R. S. Celestre, K. C. Bustillo, R. W. Falcone, D. A. Shapiro, X-Ray Nanoimaging: Instruments and Methods V, Proc. SPIE 11839, 118390D, (2021).

10.1117/12.2594172

31

In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

H. Chan, M. Mecklenburg, W. Hubbard, J. Lodico, B. Zutter, B. C. Regan, Microscopy and Microanalysis, 27, 168-169, (2021).

10.1017/s1431927621001203

32

Imaging Soft and Hard Dielectric Breakdown in Resistive Switching

B. C. Regan, J. Lodico, H. Chan, M. Mecklenburg, W. Hubbard, Microscopy and Microanalysis, 27, 2354-2355, (2021).

10.1017/s1431927621008461

33

Modern STEM EBIC: Emerging Modes and Methods

W. Hubbard, M. Mecklenburg, J. Lodico, B. Zutter, H. Chan, B. C. Regan, Microscopy and Microanalysis, 27, 2350-2352, (2021).

10.1017/s143192762100845x

34

Visualizing the Electron Wind Force in the Elastic Regime

M. Mecklenburg, B. Zutter, W. A. Hubbard, X. Ling, B. C. Regan, Microscopy and Microanalysis, 27, 106-107, (2021).

10.1017/s1431927621001008

35

Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis

T. O'Neill, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1540-1541, (2021).

10.1017/s1431927621005687

36

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

X. Ling, J. Lodico, B. C. Regan, M. Mecklenburg, Microscopy and Microanalysis, 27, 1608-1609, (2021).

10.1017/s1431927621005912

37

Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value

S. D. Findlay, H. G. Brown, P. M. Pelz, C. Ophus, J. Ciston, L. J. Allen, Microscopy and Microanalysis, 27, 744-757, (2021).

10.1017/s1431927621000490

38

Stratified Diffractive Optical Elements for Azimuthal Multiplexing

H. Wang, R. Piestun, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), (2021).

10.1364/dh.2021.dth7c.6

39

Maximizing the Field of View in Blind Ptychography

N. W. Jenkins, M. Tanksalvala, Y. Esashi, Z. Zhang, C. S. Bevis, M. N. Jacobs, P. Johnsen, C. Liao, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.1, (2021).

10.1364/cosi.2021.cw6b.1

40

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

P. M. Pelz, A. Rakowski, L. Rangel DaCosta, B. H. Savitzky, M. C. Scott, C. Ophus, Microscopy and Microanalysis, 27, 835-848, (2021).

10.1017/s1431927621012083

41

Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory

P. Denham, P. Musumeci, Proceedings of the 12th International Particle Accelerator Conference, Brazil, (2021).

10.18429/JACOW-IPAC2021-TUPAB417

42

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

B. H. Savitzky, S. E. Zeltmann, L. A. Hughes, H. G. Brown, S. Zhao, P. M. Pelz, T. C. Pekin, E. S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M. T. Janish, M. M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K. C. Bustillo, P. Ercius, M. C. Scott, J. Ciston, A. M. Minor, C. Ophus, Microscopy and Microanalysis, 27, 712-743, (2021).

10.1017/s1431927621000477

43

Multiview Virtual Confocal Microscopy Through A Multimode Fiber

S. Singh, S. Labouesse, R. Piestun, 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), (2021).

10.1109/isbi48211.2021.9433950

44

Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction

K. M. Siddiqui, D. B. Durham, F. Cropp, S. Rajpurohit, C. Ophus, Y. Zhu, J. Carlstroem, C. Stavrakas, Z. Q. Mao, A. Raja, P. Musumeci, L. Z. Tan, A. M. Minor, R. A. Kaindl, D. Filippetto, Ultrafast Phenomena and Nanophotonics XXV, (2021).

10.1117/12.2577621

45

A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams

B. Wang, M. Tanksalvala, Z. Zhang, Y. Esashi, N. Jenkins, M. Murnane, H. Kapteyn, C. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, (2021).

10.1117/12.2584728

46

Multibeam Electron Diffraction

X. Hong, S. E. Zeltmann, B. H. Savitzky, L. Rangel DaCosta, A. Müller, A. M. Minor, K. C. Bustillo, C. Ophus, Microscopy and Microanalysis, 27, 129-139, (2021).

10.1017/s1431927620024770

47

Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning

K. Kukula, D. Farmer, J. Duran, N. Majid, C. Chatterley, J. Jessing, Y. Li, 2021 IEEE 11th Annual Computing and Communication Workshop and Conference (CCWC), (2021).

10.1109/ccwc51732.2021.9375955

48

Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light

N. W. Jenkins, M. Tanksalvala, Y. Esashi, C. L. Porter, B. Wang, N. Horiguchi, M. N. Jacobs, M. Gerrity, H. C. Kapteyn, M. M. Murnane, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.ew3a.4

49

Generating Relativistic Intensities via Staged Pulse Compression in Dielectric Media

M. M. Stanfield, H. H. Allison, N. F. Beier, S. S. Hakimi, A. E. Hussein, F. F. Dollar, OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), (2020).

10.1364/euvxray.2020.jm3a.22

50

Design and testing of ultrafast plasmonic lens nanoemitters

D. B. Durham, S. Rotta Loria, F. Riminucci, K. Kanellopulos, X. Shen, F. Ciabattini, A. Mostacci, P. Musumeci, A. M. Minor, S. Cabrini, D. Filippetto, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, (2020).

10.1117/12.2567540

Publications

STROBE-contributed + Non-Refereed Publications

2024