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STROBE-contributed + Non-Refereed Publications
Showing publications 1 – 50 of 117
2024
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Mapping Moiré Potentials with STEM EBIC Imaging
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Detecting Chemical Shifts with Energy Dispersive Spectroscopy
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Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping
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Understanding Ferroelectric Polarization in Hafnium Zirconium Oxide
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Multi-Modal Extreme-Ultraviolet Reflectometer: Solving Inverse Problems in Nanostructure Metrology
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EUV scatterometry: low-dose characterization of polymer-based metamaterials
2023
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Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
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Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using extreme ultraviolet, coherent diffractive imaging reflectometry
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Soft x-ray vector ptycho-tomography: a new quantitative vector nanoimaging method for spin textures in 3D
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Elucidating the Role of Cr Migration in Ni-Cr Exposed to Molten FLiNaK via STEM-Based Methods
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Beyond MicroED: Ab Initio Structure Elucidation using 4D-STEM
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Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model
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Phase Diversity in Ptychographic Reconstructions with a Programmable Phase Plate
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Spectrum Imaging of a Lithium Ion Battery Anode Using Thin Fluid Cells
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Observation of Simultaneous Successive Twinning Using Atomic Electron Tomography
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Mapping Conductivity in the TEM with SEEBIC
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Emission-Based Temperature Mapping with STEM EBIC
2022
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Robust and reliable actinic ptychographic imaging of highly periodic structures in EUV photomasks
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High-Resolution Conductivity Mapping with STEM EBIC
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Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)
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A Multislice Approach to Quantify Laser-Induced Lattice Temperature from Ultrafast Electron Diffraction Measurements of Single-Crystal Films
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Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction
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Separation of EBIC Modes with Two-Channel STEM EBIC
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Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC
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In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution
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Commissioning of an X-Band Cavity for Longitudinal Phase Space Linearization at UCLA PEGASUS Laboratory
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Direct observation of topological magnetic monopoles using soft x-ray vector ptychography at 10 nm resolution
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Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching
2021
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4D Beam Tomography at the UCLA Pegasus Laboratory
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Soft x-ray linear dichroic ptychography: the study of crystal orientation in biominerals
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Visualizing the Electron Wind Force in the Elastic Regime
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Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis
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Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction
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In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress
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Imaging Soft and Hard Dielectric Breakdown in Resistive Switching
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Modern STEM EBIC: Emerging Modes and Methods
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Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
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Maximizing the Field of View in Blind Ptychography
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Stratified Diffractive Optical Elements for Azimuthal Multiplexing
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A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations
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Pushing Spatial Resolution Limits in Single-shot Time-resolved Transmission Electron Microscopy at the UCLA Pegasus Laboratory
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py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
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Multiview Virtual Confocal Microscopy Through A Multimode Fiber
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Visualizing the melting of periodic lattice distortions in a complex 2D charge density wave material via MeV-scale ultrafast electron diffraction
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A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams
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Multibeam Electron Diffraction
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Rapid Detection of Bacteria Using Raman Spectroscopy and Deep Learning
2020
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Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light
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