4D Scanning Transmission Electron Microscopy for Multimodal and Multiscale Materials Characterization
Abstract: Physical properties of matter depend on structure across vastly disparate length scales, from well below the atomic to macroscopic. In this talk, we’ll discuss scale-bridging scanning transmission electron microscopy (STEM) experiments and the algorithms used to quantify them, measuring quantities from picometer deformations of individual atomic columns in charge density wave materials under in-situ cryogenic cooling, to grain orientations of hundreds of crystallites in a single capture, to lattice parameter variations measured across the many micron lengths of LixFePO4 nanoplatelets in several stages of electrochemical cycling. Many of these datasets are large, and integrating computation and experiment is necessary in each case. In atom tracking with high-angle annular dark-field (HAADF)-STEM, instabilities and bubbling from the cryogen can easily spoil in-situ measurements – by combining many fast-acquisition low-signal image captures with a registration algorithm tailored to nearly uniform lattices, measuring and visualizing ~pm lattice displacements in low-temperature CDW phases is possible. In 4D-STEM, in which a 2D image of the diffracted electrons is collected at each position of the 2D beam raster, matching algorithms to experiment remains essential to make sense of the large and information rich datasets. Examples will be selected to highlight a range of modalities, methodologies, and applications, and will include Bragg localization, amorphous/crystal classification, phase identification, automated crystal orientation mapping, and others.
Speaker Bio: Ben Savitzky is a postdoctoral scientist at the National Center for Electron Microscopy in Berkeley CA. He created, maintains, and leads development of py4DSTEM, a Python software package for 4D-STEM data analysis. He completed his PhD with Lena Kourkoutis and Cornell University in 2018.