At the 2023 Advanced Lithography and Patterning Conference, Yuka Esashi was awarded the SPIE Karel Urbánek Best Student Paper Award for “Multi-modal tabletop EUV reflectometry for characterization of nanostructures.” Congratulations, Yuka!
The Karel Urbánek Best Student Paper Award recognizes the most promising contribution to the field by a student, based on the technical merit and persuasiveness of the paper presentation at the conference. The Karel Urbánek Best Student Paper Award consists of an SPIE citation and an honorarium. To be eligible, the leading author and presenter of the paper must be a student.