Anya Grafov, a graduate student in Margaret Murnane and Henry Kapteyn’s research group, received first place for her Lightning Talk titled “Measuring Magnetic Dynamics with Extreme Ultraviolet Light” at the Joint MMM-Intermag Conference in 2025. Congratulations, Anya!
UCLA physicist John Miao pioneered a new form of microscopy with unprecedented precision and field of view. In 1999, then-graduate student Jianwei “John” Miao and his colleagues at the State University of New York, Stony Brook, demonstrated that a computational algorithm, combined with patterns of scattered photons, could reveal miniscule details previously impossible to capture with conventional microscopes.
Building on an established method for determining atomic structures called X-ray crystallography, they expanded its application to structures that lack the uniform, repeating patterns found in crystals. The algorithm reconstructs images from diffraction patterns — the arrangement of electromagnetic beams after they are bent and scattered as they pass through samples. This technique diverges from traditional microscopy by combining diffraction and computation to effectively replace the objective lens.
If you imagine microscopes as computer hardware, Miao’s approach is the “killer app” that unlocks their full potential. Over the past 25 years, scientists have integrated this approach into different types of microscopes, driving the field of computational microscopy to achieve unparalleled resolution and precision, and to capture the broadest fields of view yet on samples under investigation. These advances have led to brand-new insights into the structure and behavior of catalysts, superconductors, computer chips and next-generation batteries and materials…
Graduate Student Iona Binnie has received the Best Poster Award for her poster titled “Enhanced High Harmonic Generation Beamline for Ultrafast Resonant Magnetic Scattering” at the 2025 Joint MMM-Intermag Conference in New Orleans. Congratulations, Iona!
Today, President Biden awarded nearly 400 scientists and engineers the Presidential Early Career Award for Scientists and Engineers (PECASE), the highest honor bestowed by the U.S. government on outstanding scientists and engineers early in their careers.
Established by President Clinton in 1996, PECASE recognizes scientists and engineers who show exceptional potential for leadership early in their research careers. The award recognizes innovative and far-reaching developments in science and technology, expands awareness of careers in science and engineering, recognizes the scientific missions of participating agencies, enhances connections between research and impacts on society, and highlights the importance of science and technology for our nation’s future.
From Day One of his Administration, President Biden has recognized the important role that science and technology plays in creating a better society. He made historic progress, increasing federally funded research and development and deploying past research and development at an unprecedented scale through the Bipartisan Infrastructure Law, the Inflation Reduction Act, and the CHIPS and Science Act.
This year’s awardees are employed or funded by 14 participating agencies within the Departments of Agriculture, Commerce, Defense, Education, Energy, Health and Human Services, Interior, Transportation, and Veterans Affairs and the Environmental Protection Agency, the intelligence community, the National Aeronautics and Space Administration, the National Science Foundation, and the Smithsonian Institution.
STROBE and JILA graduate student Clay Klein has been awarded the prestigious 2025 Nick Cobb Memorial Scholarship, presented by SPIE, the International Society for Optics and Photonics, and Siemens EDA. The scholarship, valued at $10,000, recognizes Klein’s outstanding contributions to the field of optics and photonics.
“I am honored to be awarded the Nick Cobb Memorial Scholarship,” Klein stated. “This scholarship provides me with the exciting opportunity to share my research in this field and connect with others in the industry at the SPIE conference in February.”
Klein conducts research in the laboratories of JILA Fellows and University of Colorado Boulder Physics professors Margaret Murnane and Henry Kapteyn. His work focuses on cutting-edge advancements in nanoscale extreme ultraviolet imaging science.
The award will be formally presented during the Welcome and Plenary Presentation at the SPIE Advanced Lithography + Patterning Conference in San Jose, California, on February 24, 2025. Congratulations Clay!
Neerja Aggarwal’s poster titled “Spectral DiffuserScope: Compact Hyperspectral Imager for Fluorescence Microscopy” received a Second Place Poster Award at the Advanced Imaging Methods Workshop at the University of California Berkeley.
The AFRL/AFOSR Chief Scientist Distinguished Lecture Series selected Dr. Laura Waller, the Charles A. Desoer Professor of Electrical Engineering and Computer Sciences at UC Berkeley, as the 2024 AFOSR Chief Scientist Distinguished Lecturer. On March 21, 2024, from 11:30 AM – 12:30 PM ET, Dr. Waller delivered a talk titled “Computational Imaging, from Microscopes to Telescopes,” exploring the joint design of imaging system hardware and software for optimized data acquisition and reconstruction.
Congratulations to Tristan O’Neill for receiving a 2024 M&M Student Poster Award for his poster titled, “Mapping Moiré Potentials with STEM EBIC Imaging.”
Graduate student Ho Leung Chan from Prof. Chris Regan’s research group at UCLA received a 2024 M&M Student Scholar Award! Her presentation is titled “Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping.”
The award consists of free registration for the meeting, $1000 travel support, and invitations to the Presidential Reception. Applicants must be bona fide students at a recognized college or university at the time of the meeting. Awards are based on the quality of the paper submitted for presentation at the meeting. The applicant must be the first author of the submitted paper. Successful applicants must present their papers personally at the meeting in order to receive the award.
Congratulations to Prof. Chris Regan and Dr. William Hubbard for receiving the 2023 Microscopy Today Innovation Award for Low Noise, Two Channel STEM EBIC System.
NEI’s STEM EBIC system enables straightforward imaging of electronic and thermal features that are otherwise difficult, if not impossible, to visualize in the TEM. Electron beam-induced current (EBIC) is a measure of the current generated in a sample as it is raster-scanned by a focused electron beam. Associating the measured EBIC with the beam position produces an EBIC image. First implemented in the 1960s, EBIC imaging is usually performed in a scanning electron microscope (SEM) to map electric fields in microelectronic devices. For instance, the built-in electric field of a p-n junction separates electron-hole pairs generated by the beam, producing a strong EBIC signal. Recently, thousand-fold improvements in current measurement sensitivity have led to practical EBIC imaging in scanning transmission electron microscopes (STEMs). This improved sensitivity reveals previously undetectable EBICs. In particular, the EBIC generated by secondary electron emission (SEEBIC) can now be routinely visualized.
Standard TEM-based techniques excel at determining the physical structure of a sample—the atomic locations and elemental identities—but they struggle to distinguish a metal from an insulator, or a warm interconnect from a cold one. In microelectronic devices, such electronic and thermal structure is generally of greater interest than the physical structure. STEM SEEBIC-based imaging of micro- and nano-electronic devices reveals these signals at high resolution. It can, for instance, quantitatively map conductivity, electric field, temperature, SE yield, active dopant concentration, and work function.
NEI’s STEM EBIC system is a turn-key solution for measuring extremely small EBICs. Low-noise STEM EBIC images of sub-pA signals, including SEEBIC, can be acquired in under two minutes. Extrinsic noise (for example, line noise) is nearly undetectable, so image filtering and post-processing are not necessary. The system—featuring a sample holder, custom substrates, and electronics optimized for EBIC in the TEM—is equipped with two independent EBIC amplifier channels for acquiring EBIC from different electrodes simultaneously. Two-channel EBIC can definitively separate SEEBIC from standard EBIC in situations where both are present, which greatly facilitates analysis and interpretation. NEI’s STEM EBIC system is designed to work with other in situ techniques, including heating and biasing on either custom-fabricated test devices or FIB-extracted cross-sectional samples.