Electromigration of Copper in Lithographically-Defined Aluminum NanowiresRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2018 Authors Zutter, Brian, Mecklenburg, Matthew, Aloni, Shaul, Regan, B. C. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 24 Issue 1 Pages 2190-2191 Publication Date 2018-08-01 Publisher Cambridge University Press (CUP) ISSN 1431-9276 URL http://dx.doi.org/10.1017/S1431927618011431 DOI 10.1017/s1431927618011431 PDF of Paper Previous Next