A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography

Refereed Designation:Refereed
Publication Type
Journal Article
Publication Year
2020
Authors
Ren, David,
Ophus, Colin,
Chen, Michael,
Waller, Laura
Journal
Ultramicroscopy
Short Title
Ultramicroscopy
Volume
208
Pages
112860
Publication Date
2020-01
Publisher
Elsevier BV
ISSN
3043991
URL
http://dx.doi.org/10.1016/j.ultramic.2019.112860
DOI
10.1016/j.ultramic.2019.112860

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