STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

Refereed Designation:Non-refereed/STROBE-contributed
Publication Type
Journal Article
Publication Year
2020
Authors
Hubbard, William,
Mecklenburg, Matthew,
Regan, B. C.
Journal
Microscopy and Microanalysis
Short Title
Microsc Microanal
Volume
26
Pages
3124-3125
Publication Date
2020-07-30
Publisher
Cambridge University Press (CUP)
URL
http://dx.doi.org/10.1017/S1431927620023880
DOI
10.1017/s1431927620023880

PDF of Paper