STEM EBIC Thermometry Calibration with PEET on Al NanoparticlesRefereed Designation:Non-refereed/STROBE-contributed Publication Type Journal Article Publication Year 2020 Authors Hubbard, William, Mecklenburg, Matthew, Regan, B. C. Journal Microscopy and Microanalysis Short Title Microsc Microanal Volume 26 Pages 3124-3125 Publication Date 2020-07-30 Publisher Cambridge University Press (CUP) URL http://dx.doi.org/10.1017/S1431927620023880 DOI 10.1017/s1431927620023880 PDF of Paper Previous Next