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The development of twisted van der Waals (vdW) heterostructures—where layers of 2D materials are stacked with controlled rotation angles—has opened exciting opportunities in quantum technologies. Notably, the twist interfaces in hexagonal boron nitride (h-BN) can undergo structural transformations that support single-photon emission, making them promising for quantum sensing. However, imaging these buried interfaces using scanning transmission electron microscopy (STEM) has been challenging due to poor signal quality and geometric constraints.

In this work, we demonstrated the use of multislice ptychography (MSP), a sensitive coherent diffractive imaging technique, to visualize a twisted h-BN interface from a single-view dataset. STEM experiments were conducted on the TEAM I microscope at the National Center for Electron Microscopy, LBNL, where we acquired diffraction patterns from a 12-nm-thick twisted h-BN sample. Unlike conventional ptychographic approaches that yield a single complex image of the sample, MSP enables depth-sectioning during post-processing, producing a series of reconstructed image slices.

We successfully reconstructed 24 slices of the twisted h-BN heterostructure, resolving the top flake, interface, and bottom flake with a lateral resolution of 0.57 Å. Remarkably, a depth resolution of 2.5 nm was achieved without sample tilting—the highest reported depth resolution at the time of publication. This work highlights MSP’s potential to resolve nanoscale features in three dimensions without requiring tomographic data acquisition, paving the way for advanced quantum materials characterization.

Nanoscale metrology using coherent extreme-ultraviolet (EUV) or soft x-ray (SXR) light has unique advantages for a broad range of science and technology. Short EUV/SXR wavelengths have high sensitivity to small features, elemental composition, as well as electronic and magnetic orders. Tabletop high harmonic sources (HHG) have high spatial and temporal coherence, enabling precise phase-sensitive measurements of nanoscale functional properties (e.g. transport and mechanical), as well as diffraction-limited imaging with both amplitude and phase contrast. However, to date, most EUV HHG measurements were performed on hard materials, where damage is not significant concern.

STROBE scientists demonstrated that EUV HHG can rapidly and nondestructively characterize dose-sensitive materials such as polymer-based structures, with higher spatial resolution than visible light, and with far less damage than electron imaging. They collaborated with scientists from 3M to characterize polymer metamaterials, that have 2D periodic features less than the wavelength of visible light. Using HHG scatterometry, they extracted layer thicknesses, densities and top-surface geometry, without the need to coat or cut the sample. In contrast, SEM imaging of this polymer metamaterial requires that the sample be coated, and the high-energy electron beam can cause shrinking (see Fig.). Here, the significantly lower photon energy (~42eV) of EUV HHG compared with electron beams (~1-30keV) is key to lowering the dose, while maintaining high spatial resolution (<60nm transverse and <nm axial). Finally, correlative electron imaging, which requires highly specialized sample preparation to avoid sample damage, was implemented to validate the EUV HHG findings.

Computational imaging reconstructions from multiple measurements that are captured sequentially often suffer from motion artifacts if the scene is dynamic. We propose a neural space–time model (NSTM) that jointly estimates the scene and its motion dynamics, without data priors or pre-training. Hence, we can both remove motion artifacts and resolve sample dynamics from the same set of raw measurements used for the conventional reconstruction. We demonstrate NSTM in three computational imaging systems: differential phase-contrast microscopy, three-dimensional structured illumination microscopy and rolling-shutter DiffuserCam. We show that NSTM can recover subcellular motion dynamics and thus reduce the misinterpretation of living systems caused by motion artifacts.

At the ultimate scaling limit, electronic memory would store bits of information by shifting atoms back and forth inside individual crystalline unit cells. Ferroelectric materials exhibit the electronic hysteresis required to realize this ideal. However, despite the perfect alignment between a material class and an economically important application, ferroelectric computer memory has almost zero commercial presence.

The materials properties that are possible in principle are not realized in practice. Strain, defects, phase competition, and inhomogenieties all confuse the experimental picture. Previously it has been difficult to look inside a ferroelectric to see what is going on.  The standard high-resolution imaging techniques, piezo-force microscopy (PFM) and transmission electron microscopy (TEM), struggle to visualize the electric and polarization fields that are the hallmarks of ferroelectricity. Understanding why ferroelectric materials have not yet lived up to their potential is widely recognized open problem.

Using scanning TEM (STEM) electron beam-induced current (EBIC) imaging, we map the electric fields in a Hf_0.5Zr_0.5O₂ capacitor, obtaining a view of the material’s ferroelectric properties that is unprecedented in its completeness. We map the whole device and  inside nanoscale domains, correlating global free currents with local polarization reversals. In individual domains we isolate and measure the remanent background E-field that does not switch, and we show that this field determines the coercive E-field required to switch the domain. These measurements connect the nanoscopic crystal structure to the mesoscopic materials properties that ultimately determine device function.