Optimizing Workflows for Machine Learning Analysis of Electron Microscopy Data
The increasing ability to perform high throughput electron microscopy has created a need for robust, automated analysis that appears addressable by machine learning (ML) tools. Approaches such as convolutional neural nets (CNNs) are finding increased application in scientific data analysis tasks, including analysis of electron microscopy imaging data. However, electron microscopy data varies significantly from natural images. To provide robust ML analysis for increasingly large and complex electron microscopy datasets, we have performed experimental and simulated studies to examine how experimental variation should be included in a training dataset for robust performance and maximum accuracy across workflows. We have also analyzed the role that network architecture plays, and present methods to increase performance of lightweight networks. Ultimately, our tools advance performance of ML workflows that can shed light on structural variation and correlation of large populations of nanomaterials from imaging data.